Pub Date : 2011-10-01DOI: 10.1109/CEIDP.2011.6232719
G. Laity, A. Fierro, L. Hatfield, A. Neuber
This paper describes recent experiments to study selfproduced vacuum ultraviolet (VUV) emission from pulsed atmospheric plasma structures. While it has been classically believed that photo-ionization plays a significant role on plasma generation during fast timescales (i.e. streamers), the exact role of VUV radiation (energy greater than 7 eV) has only recently been explored and is currently an area of interest for the development of high power devices in the aerospace community. Since VUV emission is heavily absorbed by molecular oxygen and most optical materials, the direct observation of VUV radiation produced by atmospheric pressure plasmas is challenging. Experiments at Texas Tech University were performed with multiple vacuum monochromators, custom designed VUV transparent optical instruments, VUV sensitive intensified CCD and photomultiplier time-resolved diagnostics, and nanosecondtimescale electrical probes of the plasma. Previous studies were limited due to the non-linearity of the focusing optics used for VUV transmission, and thus the current experiment was designed to minimize chromatic abberation of recorded emission in the VUV regime of interest (115 – 135 nm). Quantitative observation of VUV emission from surface flashover in air revealed that the majority of emission is due to radiation from atomic oxygen and nitrogen in the wavelength range 130 – 135 nm, which has been confirmed by spectral calculation for an estimated Boltzmann temperature of 10 eV. High resolution spectral measurements in the range 115 – 130 nm also led to observation of various impurities along the surface, which were only observable due to the upgraded focusing system. Finally, time resolved measurements showed that the earliest VUV emission occurs during the streamer phase, where the recorded signal-to-noise ratio of the observed emission has been significantly increased due to more efficient optical diagnostics.
{"title":"Exploration of self-produced vacuum ultraviolet radiation from dielectric surface flashover at atmospheric pressure","authors":"G. Laity, A. Fierro, L. Hatfield, A. Neuber","doi":"10.1109/CEIDP.2011.6232719","DOIUrl":"https://doi.org/10.1109/CEIDP.2011.6232719","url":null,"abstract":"This paper describes recent experiments to study selfproduced vacuum ultraviolet (VUV) emission from pulsed atmospheric plasma structures. While it has been classically believed that photo-ionization plays a significant role on plasma generation during fast timescales (i.e. streamers), the exact role of VUV radiation (energy greater than 7 eV) has only recently been explored and is currently an area of interest for the development of high power devices in the aerospace community. Since VUV emission is heavily absorbed by molecular oxygen and most optical materials, the direct observation of VUV radiation produced by atmospheric pressure plasmas is challenging. Experiments at Texas Tech University were performed with multiple vacuum monochromators, custom designed VUV transparent optical instruments, VUV sensitive intensified CCD and photomultiplier time-resolved diagnostics, and nanosecondtimescale electrical probes of the plasma. Previous studies were limited due to the non-linearity of the focusing optics used for VUV transmission, and thus the current experiment was designed to minimize chromatic abberation of recorded emission in the VUV regime of interest (115 – 135 nm). Quantitative observation of VUV emission from surface flashover in air revealed that the majority of emission is due to radiation from atomic oxygen and nitrogen in the wavelength range 130 – 135 nm, which has been confirmed by spectral calculation for an estimated Boltzmann temperature of 10 eV. High resolution spectral measurements in the range 115 – 130 nm also led to observation of various impurities along the surface, which were only observable due to the upgraded focusing system. Finally, time resolved measurements showed that the earliest VUV emission occurs during the streamer phase, where the recorded signal-to-noise ratio of the observed emission has been significantly increased due to more efficient optical diagnostics.","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"18 1","pages":"563-566"},"PeriodicalIF":0.0,"publicationDate":"2011-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91397853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69560
J. Crine, A. Vijh
An attempt is made to show that there is a relation between the amount of transferred charge and the free energy (per equivalent) of oxide formation on the metal at a metal-polymer interface. The authors show that there is an approximate linear relation between the amount of charge transferred to polymers and their cohesive energy density (CED), for a given metal electrode. It is suggested that existing data can be described with two empirical linear relations. They imply that there is a triboelectric series among polymers, with negatively charged polymers having the lowest CED and those with high CED being positively charged; and the charge transfer mechanism is partially controlled by the oxide layer on the metal electrode. This means that noble metals (such as gold) are less affected by this phenomenon and therefore are more likely to give the true charge transferred to the polymer.<>
{"title":"Influence of the cohesive energy density of polymers and of the nature of metal-polymer interface on the contact charging of polymers","authors":"J. Crine, A. Vijh","doi":"10.1109/CEIDP.1989.69560","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69560","url":null,"abstract":"An attempt is made to show that there is a relation between the amount of transferred charge and the free energy (per equivalent) of oxide formation on the metal at a metal-polymer interface. The authors show that there is an approximate linear relation between the amount of charge transferred to polymers and their cohesive energy density (CED), for a given metal electrode. It is suggested that existing data can be described with two empirical linear relations. They imply that there is a triboelectric series among polymers, with negatively charged polymers having the lowest CED and those with high CED being positively charged; and the charge transfer mechanism is partially controlled by the oxide layer on the metal electrode. This means that noble metals (such as gold) are less affected by this phenomenon and therefore are more likely to give the true charge transferred to the polymer.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"46 1","pages":"284-289"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75322038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69555
N. Hozumi, J. Tanaka, A. De Reggi, N. Nagusrinivas
Measurements of space charges induced by poling have been made on XLPE (cross-linked polyethylene) samples cut from AC cables aged under different conditions. The approximately 220- mu m-thick samples were obtained by peeling. Gold electrodes were evaporated on the samples, the samples were poled at approximately 0.12 MV/cm (2.75 kV per sample) for three hours at 70 degrees C, and the space charge was determined by the thermal pulse technique. The amount of space charge induced in different samples by identical poling conditions was larger in the samples with the longer exposure to AC stress. The total amount of space charge which could be induced by poling was also found to correlate with other parameters, such as AC breakdown strength. In addition, the space charge dissipation rate was monitored for several weeks after poling. Samples aged at room temperature with both electrodes grounded retained more than half their original space charge after one week. It is noted that it is highly probable that the determination of space charges will be a powerful method for estimating the degree of degradation of aged cables.<>
{"title":"Space charge induced in stressed polyethylene","authors":"N. Hozumi, J. Tanaka, A. De Reggi, N. Nagusrinivas","doi":"10.1109/CEIDP.1989.69555","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69555","url":null,"abstract":"Measurements of space charges induced by poling have been made on XLPE (cross-linked polyethylene) samples cut from AC cables aged under different conditions. The approximately 220- mu m-thick samples were obtained by peeling. Gold electrodes were evaporated on the samples, the samples were poled at approximately 0.12 MV/cm (2.75 kV per sample) for three hours at 70 degrees C, and the space charge was determined by the thermal pulse technique. The amount of space charge induced in different samples by identical poling conditions was larger in the samples with the longer exposure to AC stress. The total amount of space charge which could be induced by poling was also found to correlate with other parameters, such as AC breakdown strength. In addition, the space charge dissipation rate was monitored for several weeks after poling. Samples aged at room temperature with both electrodes grounded retained more than half their original space charge after one week. It is noted that it is highly probable that the determination of space charges will be a powerful method for estimating the degree of degradation of aged cables.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"39 1","pages":"253-258"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74789573","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69525
W. W. Guo, T. Guo
An inverse scattering formulation for retrieving three-dimensional profiles of dielectric permittivity is presented. It yields quantitative dielectric images of a target, with resolution limited only by signal-to-noise ratio, and not by wavelength or diffraction. To overcome the wavelength limitation, scattering data in the near zone are utilized, and a method of least-mean-square and singular value decomposition is used to stabilize the matrix inversion. Results from computer simulation with an electrostatic model are shown to provide good images. As the electrostatic field is equivalent to an electrodynamic field with infinite wavelength, it illustrates the possibility of imaging by inverse scattering with resolution unlimited by wavelength.<>
{"title":"Three-dimensional dielectric imaging by microwave inverse scattering with resolution unlimited by wavelength","authors":"W. W. Guo, T. Guo","doi":"10.1109/CEIDP.1989.69525","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69525","url":null,"abstract":"An inverse scattering formulation for retrieving three-dimensional profiles of dielectric permittivity is presented. It yields quantitative dielectric images of a target, with resolution limited only by signal-to-noise ratio, and not by wavelength or diffraction. To overcome the wavelength limitation, scattering data in the near zone are utilized, and a method of least-mean-square and singular value decomposition is used to stabilize the matrix inversion. Results from computer simulation with an electrostatic model are shown to provide good images. As the electrostatic field is equivalent to an electrodynamic field with infinite wavelength, it illustrates the possibility of imaging by inverse scattering with resolution unlimited by wavelength.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"38 1","pages":"65-74"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78034804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69558
G. Raju
The measurement of TSD (thermally stimulated discharge) currents in Nomex is reported. The TSD currents were measured by heating the sample at a uniform rate. Both the temperature and the current were measured using a strip chart recorder having a sensitivity of 2 mu V/mm and 10/sup -14/ A/mm, respectively. Detailed results are presented.<>
报道了在Nomex测量TSD(热激放电)电流。以均匀速率加热样品，测量TSD电流。温度和电流均使用灵敏度分别为2 μ V/mm和10/sup -14/ a /mm的条形图记录仪进行测量。给出了详细的结果。
{"title":"Thermally stimulated discharge currents in high temperature dielectrics","authors":"G. Raju","doi":"10.1109/CEIDP.1989.69558","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69558","url":null,"abstract":"The measurement of TSD (thermally stimulated discharge) currents in Nomex is reported. The TSD currents were measured by heating the sample at a uniform rate. Both the temperature and the current were measured using a strip chart recorder having a sensitivity of 2 mu V/mm and 10/sup -14/ A/mm, respectively. Detailed results are presented.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"30 1","pages":"272-277"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72852420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69548
A. Frederickson, P. McGrath, P. Leung
A mechanism is determined for the induction of electrical breakdown in thick solid insulating material exposed to high-energy particles or photons. The authors have found a mechanism where common radiation levels, greater than on the order of 100 rad/h, will induce breakdown in insulators under typical high levels of applied electric field stress. In the experiments reported here, an attempt was made to determine if beam-induced discharges could couple with an applied (battery or power supply) electric stress and result in full insulator failure. Without applied voltages, the discharges were transient and the insulators recovered their properties within microseconds, even though the beam continued after the discharge. A model explaining the experimental results is developed. It is seen that peculiar combinations of geometry and radiation are required in order to produce radiation-initiated breakdown. The radiation must induce high fields over a small volume of the insulator so that the normal bias levels can invert the space-charge-induced fields through the rest of the dielectric. Also, before it quenches, the streamer must propagate fully through the insulator. These conditions can be used to encourage the occurrence of the breakdown, or one can choose geometries to avoid the problem.<>
{"title":"Radiation-induced electrical insulator breakdown","authors":"A. Frederickson, P. McGrath, P. Leung","doi":"10.1109/CEIDP.1989.69548","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69548","url":null,"abstract":"A mechanism is determined for the induction of electrical breakdown in thick solid insulating material exposed to high-energy particles or photons. The authors have found a mechanism where common radiation levels, greater than on the order of 100 rad/h, will induce breakdown in insulators under typical high levels of applied electric field stress. In the experiments reported here, an attempt was made to determine if beam-induced discharges could couple with an applied (battery or power supply) electric stress and result in full insulator failure. Without applied voltages, the discharges were transient and the insulators recovered their properties within microseconds, even though the beam continued after the discharge. A model explaining the experimental results is developed. It is seen that peculiar combinations of geometry and radiation are required in order to produce radiation-initiated breakdown. The radiation must induce high fields over a small volume of the insulator so that the normal bias levels can invert the space-charge-induced fields through the rest of the dielectric. Also, before it quenches, the streamer must propagate fully through the insulator. These conditions can be used to encourage the occurrence of the breakdown, or one can choose geometries to avoid the problem.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"13 1","pages":"210-217"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81378524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69527
J.Y. Thalji, J. K. Nelson
The authors investigate the impulse waveform effects on the initiation, propagation, and stabilization of gas discharges over a wide range of pressures in SF/sub 6/. Impulses are generated by a Fletcher type generator. By changing the internal pulse forming components, 0.0075/80- and 0.6/80- mu s surges can be generated and applied to a 0.25-mm-radius stainless steel point forming a 5-mm point/plane SF/sub 6/ gap. Discharge development is recorded by a collimated photomultiplier with quartz optics forward focused to view the whole gap. Extensive studies of the patterns of light emission have indicated that three distinct modes of discharge development exist. Although all of the modes identified are present at 0.4 MPa under a lightning surge application, the mode incidence is very different, the preponderance depending both on pressure and on risetime. Mode A is always present and results in breakdown in the majority of cases for both fast and slow pulse application. However, the stabilized mode (Mode B) is highly dependent on pressure and only present for the slow rising impulses. Mode C is present only at high pressure (above 0.3 MPa) and occurs independent of impulse risetime.<>
{"title":"Impulse waveform effects on negative point breakdown phenomena in SF/sub 6/","authors":"J.Y. Thalji, J. K. Nelson","doi":"10.1109/CEIDP.1989.69527","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69527","url":null,"abstract":"The authors investigate the impulse waveform effects on the initiation, propagation, and stabilization of gas discharges over a wide range of pressures in SF/sub 6/. Impulses are generated by a Fletcher type generator. By changing the internal pulse forming components, 0.0075/80- and 0.6/80- mu s surges can be generated and applied to a 0.25-mm-radius stainless steel point forming a 5-mm point/plane SF/sub 6/ gap. Discharge development is recorded by a collimated photomultiplier with quartz optics forward focused to view the whole gap. Extensive studies of the patterns of light emission have indicated that three distinct modes of discharge development exist. Although all of the modes identified are present at 0.4 MPa under a lightning surge application, the mode incidence is very different, the preponderance depending both on pressure and on risetime. Mode A is always present and results in breakdown in the majority of cases for both fast and slow pulse application. However, the stabilized mode (Mode B) is highly dependent on pressure and only present for the slow rising impulses. Mode C is present only at high pressure (above 0.3 MPa) and occurs independent of impulse risetime.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"17 1","pages":"81-86"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81943700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69540
J. Crine, J. Parpal, C. Dang
A simple model partially based on the rate theory is proposed to describe the electric aging of polyethylene (PE) and cross-linked PE (XLPE) cable insulation. It is assumed that the stress (electric or mechanical) reduces the height of the energy barrier controlling the process under study. The model describes very different effects of high electric fields on the properties of polymers. It relies on two parameters whose physical significance is discussed in the light of electric aging of PE and polarization reversal of PVDF. A preliminary study indicates that very long lifetimes of polymers can be achieved provided the applied field is lower than the critical field controlled by the chemical and morphological structure of the material.<>
{"title":"A new approach to the electric aging of dielectrics","authors":"J. Crine, J. Parpal, C. Dang","doi":"10.1109/CEIDP.1989.69540","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69540","url":null,"abstract":"A simple model partially based on the rate theory is proposed to describe the electric aging of polyethylene (PE) and cross-linked PE (XLPE) cable insulation. It is assumed that the stress (electric or mechanical) reduces the height of the energy barrier controlling the process under study. The model describes very different effects of high electric fields on the properties of polymers. It relies on two parameters whose physical significance is discussed in the light of electric aging of PE and polarization reversal of PVDF. A preliminary study indicates that very long lifetimes of polymers can be achieved provided the applied field is lower than the critical field controlled by the chemical and morphological structure of the material.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"59 1","pages":"161-167"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88025384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69566
H. Kliem, P. Fuhrmann
Arkel and Snoek (1934) reported on the dielectric behavior of concentrated solutions of dipole substances. They found that the polarization shows a marked decrease with increasing dipole concentration. In the present work, it is deduced that such a behavior can be explained by nonlinear electrostatic dipole interaction. At high concentration the counteracting dipolar fields become much higher than external field strengths usually applied to the dielectric. The polarization of N>
{"title":"A computer simulation of the interaction between randomly distributed dipoles","authors":"H. Kliem, P. Fuhrmann","doi":"10.1109/CEIDP.1989.69566","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69566","url":null,"abstract":"Arkel and Snoek (1934) reported on the dielectric behavior of concentrated solutions of dipole substances. They found that the polarization shows a marked decrease with increasing dipole concentration. In the present work, it is deduced that such a behavior can be explained by nonlinear electrostatic dipole interaction. At high concentration the counteracting dipolar fields become much higher than external field strengths usually applied to the dielectric. The polarization of N<or=400 nonlinear interacting bidirectional dipoles distributed randomly between two electrodes is calculated. Computer simulation shows that the electrostatic dipole-dipole interaction in disordered systems of bidirectional dipoles leads to a decrease of the static polarization of the dielectric. The effect increases with increasing dipole moment and increasing dipole concentration.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"31 1","pages":"321-326"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82713963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1989-10-29DOI: 10.1109/CEIDP.1989.69592
S. Yajima, M. Sone, H. Mitsui, S. Hirabayashi
Experimental measurements of the effect of mist formation in vapor-mist dielectrics on impulse breakdown are presented. The water breakdown voltages are shown to increase as the temperature falls to the boiling point. This is an effect of the mist formation. The mist formation is also shown for benzene, hexane, ethyl alcohol, methyl alcohol, Freon R-11, R-113, R-11-R-113 mixture, R-113-R-114 mixture, and R-113-R-12 mixture mist. The electrical strength of the mist depends on the mass increase of clusters.<>
介绍了气雾介质中雾的形成对脉冲击穿影响的实验测量结果。当温度降至沸点时，水的击穿电压增加。这是雾形成的结果。还显示了苯、己烷、乙醇、甲醇、氟利昂R-11、R-113、R-11-R-113混合物、R-113- r -114混合物和R-113- r -12混合物雾的形成。雾的电强度取决于团簇质量的增加。
{"title":"Effect of mist formation in vapor-mist dielectrics on breakdown","authors":"S. Yajima, M. Sone, H. Mitsui, S. Hirabayashi","doi":"10.1109/CEIDP.1989.69592","DOIUrl":"https://doi.org/10.1109/CEIDP.1989.69592","url":null,"abstract":"Experimental measurements of the effect of mist formation in vapor-mist dielectrics on impulse breakdown are presented. The water breakdown voltages are shown to increase as the temperature falls to the boiling point. This is an effect of the mist formation. The mist formation is also shown for benzene, hexane, ethyl alcohol, methyl alcohol, Freon R-11, R-113, R-11-R-113 mixture, R-113-R-114 mixture, and R-113-R-12 mixture mist. The electrical strength of the mist depends on the mass increase of clusters.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"77 1","pages":"477-482"},"PeriodicalIF":0.0,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88980969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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