一个45nm弹性和自适应微处理器核心的动态变化容忍

J. Tschanz, K. Bowman, Shih-Lien Lu, Paolo A. Aseron, M. Khellah, A. Raychowdhury, B. Geuskens, Carlos Tokunaga, C. Wilkerson, T. Karnik, V. De
{"title":"一个45nm弹性和自适应微处理器核心的动态变化容忍","authors":"J. Tschanz, K. Bowman, Shih-Lien Lu, Paolo A. Aseron, M. Khellah, A. Raychowdhury, B. Geuskens, Carlos Tokunaga, C. Wilkerson, T. Karnik, V. De","doi":"10.1109/ISSCC.2010.5433922","DOIUrl":null,"url":null,"abstract":"Microprocessors experience a wide range of dynamic variations, including voltage droops, temperature changes, and device aging, which vary across applications and systems. The necessity of ensuring correct operation even under infrequent worst-case conditions results in clock frequency (FCLK) or supply voltage (VCC) guardbands that degrade performance and increase energy consumption. In this paper, a research microprocessor core is described with resilient and adaptive circuits to mitigate dynamic variation guardbands for maximizing throughput or minimizing energy. The resiliency features consist of embedded error-detection sequentials (EDS) [1-4] and tunable replica circuits (TRC) [5] in conjunction with error-recovery circuits to detect and correct timing errors. A new instruction-replay error-recovery technique is introduced to correct errant instructions with low performance cost and implementation overhead. In addition, the microprocessor contains an adaptive clock controller based on error statistics to operate at maximum efficiency across a range of dynamic variations.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":"42 1","pages":"282-283"},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"69","resultStr":"{\"title\":\"A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance\",\"authors\":\"J. Tschanz, K. Bowman, Shih-Lien Lu, Paolo A. Aseron, M. Khellah, A. Raychowdhury, B. Geuskens, Carlos Tokunaga, C. Wilkerson, T. Karnik, V. De\",\"doi\":\"10.1109/ISSCC.2010.5433922\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Microprocessors experience a wide range of dynamic variations, including voltage droops, temperature changes, and device aging, which vary across applications and systems. The necessity of ensuring correct operation even under infrequent worst-case conditions results in clock frequency (FCLK) or supply voltage (VCC) guardbands that degrade performance and increase energy consumption. In this paper, a research microprocessor core is described with resilient and adaptive circuits to mitigate dynamic variation guardbands for maximizing throughput or minimizing energy. The resiliency features consist of embedded error-detection sequentials (EDS) [1-4] and tunable replica circuits (TRC) [5] in conjunction with error-recovery circuits to detect and correct timing errors. A new instruction-replay error-recovery technique is introduced to correct errant instructions with low performance cost and implementation overhead. In addition, the microprocessor contains an adaptive clock controller based on error statistics to operate at maximum efficiency across a range of dynamic variations.\",\"PeriodicalId\":6418,\"journal\":{\"name\":\"2010 IEEE International Solid-State Circuits Conference - (ISSCC)\",\"volume\":\"42 1\",\"pages\":\"282-283\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-03-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"69\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Solid-State Circuits Conference - (ISSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2010.5433922\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2010.5433922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 69

摘要

微处理器经历了广泛的动态变化,包括电压下降、温度变化和器件老化,这些变化因应用程序和系统而异。即使在不常见的最坏情况下,也需要确保正确的操作,这导致时钟频率(FCLK)或电源电压(VCC)保护带降低了性能并增加了能耗。本文描述了一种具有弹性和自适应电路的研究微处理器内核,以减轻动态变化的保护带,以最大化吞吐量或最小化能量。弹性特性包括嵌入式错误检测序列(EDS)[1-4]和可调复制电路(TRC)[5],以及用于检测和纠正时序错误的错误恢复电路。提出了一种新的指令重放错误恢复技术,以较低的性能成本和实现开销来纠正错误指令。此外,微处理器包含一个基于误差统计的自适应时钟控制器,以便在一系列动态变化中以最高效率运行。
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A 45nm resilient and adaptive microprocessor core for dynamic variation tolerance
Microprocessors experience a wide range of dynamic variations, including voltage droops, temperature changes, and device aging, which vary across applications and systems. The necessity of ensuring correct operation even under infrequent worst-case conditions results in clock frequency (FCLK) or supply voltage (VCC) guardbands that degrade performance and increase energy consumption. In this paper, a research microprocessor core is described with resilient and adaptive circuits to mitigate dynamic variation guardbands for maximizing throughput or minimizing energy. The resiliency features consist of embedded error-detection sequentials (EDS) [1-4] and tunable replica circuits (TRC) [5] in conjunction with error-recovery circuits to detect and correct timing errors. A new instruction-replay error-recovery technique is introduced to correct errant instructions with low performance cost and implementation overhead. In addition, the microprocessor contains an adaptive clock controller based on error statistics to operate at maximum efficiency across a range of dynamic variations.
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