系统级ESD测试的优化统计方法

IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1992-01-01 DOI:10.1109/ISEMC.1992.626150

R. Renninger

{"title":"系统级ESD测试的优化统计方法","authors":"R. Renninger","doi":"10.1109/ISEMC.1992.626150","DOIUrl":null,"url":null,"abstract":"A new method for system-level electrostatic discharge (ESD) tests uses the Mean Time Between Undesired Responses (MTBUR) as the ESD immunity criterion. The MTBUR and other related parameters directly measure a system’s reliability in a particular ESD environment. To arrive at the most efficient possible test plan, the technique calculates the minimum number of ESD pulses a system must withstand to verify, with a specified statistical confidence level, that it has a given MTBUR in a given ESD environment.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"92 2 1","pages":"474-484"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Ptimized Statistical Method For System-level ESD Tests\",\"authors\":\"R. Renninger\",\"doi\":\"10.1109/ISEMC.1992.626150\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new method for system-level electrostatic discharge (ESD) tests uses the Mean Time Between Undesired Responses (MTBUR) as the ESD immunity criterion. The MTBUR and other related parameters directly measure a system’s reliability in a particular ESD environment. To arrive at the most efficient possible test plan, the technique calculates the minimum number of ESD pulses a system must withstand to verify, with a specified statistical confidence level, that it has a given MTBUR in a given ESD environment.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"92 2 1\",\"pages\":\"474-484\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626150\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626150","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 7

摘要

一种新的系统级静电放电(ESD)测试方法，采用非期望响应间隔时间(MTBUR)作为ESD抗扰度判据。MTBUR和其他相关参数直接衡量系统在特定ESD环境中的可靠性。为了获得最有效的测试计划，该技术计算系统必须承受的最小ESD脉冲数，以指定的统计置信水平验证系统在给定的ESD环境中具有给定的MTBUR。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文

微信好友朋友圈 QQ好友复制链接

本刊更多论文

Ptimized Statistical Method For System-level ESD Tests

A new method for system-level electrostatic discharge (ESD) tests uses the Mean Time Between Undesired Responses (MTBUR) as the ESD immunity criterion. The MTBUR and other related parameters directly measure a system’s reliability in a particular ESD environment. To arrive at the most efficient possible test plan, the technique calculates the minimum number of ESD pulses a system must withstand to verify, with a specified statistical confidence level, that it has a given MTBUR in a given ESD environment.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility

CiteScore

0.30

自引率

0.00%

发文量