{"title":"22≤Z≤29元素在不同能量下K - x射线荧光截面的变化","authors":"E. Baydaş, Y. Sahin, E. Büyükkasap","doi":"10.1081/TMA-120023060","DOIUrl":null,"url":null,"abstract":"Abstract K X-ray fluorescence cross-sections were experimentally determined for elements in the range 22 ≤ Z ≤ 29 at various energies using secondary excitation method. K X-rays emitted by samples were counted by a Si(Li) detector with resolution 160 eV at 5.9 keV. Obtained values were compared with the calculated values. The experimental values are systematically higher than the theoretical values.","PeriodicalId":17525,"journal":{"name":"Journal of Trace and Microprobe Techniques","volume":"67 1","pages":"433 - 442"},"PeriodicalIF":0.0000,"publicationDate":"2003-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Variation of K X-Ray Fluorescence Cross-Sections for Elements in the Range 22 ≤ Z ≤ 29 at Various Energies\",\"authors\":\"E. Baydaş, Y. Sahin, E. Büyükkasap\",\"doi\":\"10.1081/TMA-120023060\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract K X-ray fluorescence cross-sections were experimentally determined for elements in the range 22 ≤ Z ≤ 29 at various energies using secondary excitation method. K X-rays emitted by samples were counted by a Si(Li) detector with resolution 160 eV at 5.9 keV. Obtained values were compared with the calculated values. The experimental values are systematically higher than the theoretical values.\",\"PeriodicalId\":17525,\"journal\":{\"name\":\"Journal of Trace and Microprobe Techniques\",\"volume\":\"67 1\",\"pages\":\"433 - 442\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Trace and Microprobe Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1081/TMA-120023060\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Trace and Microprobe Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1081/TMA-120023060","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Variation of K X-Ray Fluorescence Cross-Sections for Elements in the Range 22 ≤ Z ≤ 29 at Various Energies
Abstract K X-ray fluorescence cross-sections were experimentally determined for elements in the range 22 ≤ Z ≤ 29 at various energies using secondary excitation method. K X-rays emitted by samples were counted by a Si(Li) detector with resolution 160 eV at 5.9 keV. Obtained values were compared with the calculated values. The experimental values are systematically higher than the theoretical values.
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