移动、物联网和汽车应用层压板的技术进步

Ken Lee, Min Sung Kim, Peter Shim, Ica Han, Jack Lee, Jeffery Chun, Samuel Cha
{"title":"移动、物联网和汽车应用层压板的技术进步","authors":"Ken Lee, Min Sung Kim, Peter Shim, Ica Han, Jack Lee, Jeffery Chun, Samuel Cha","doi":"10.1109/CSTIC.2017.7919867","DOIUrl":null,"url":null,"abstract":"The increasing level of integration in electronic devices requires high density package substrates with good electrical and thermal performance, and high reliability. Organic laminate substrates have been serving these requirements with their continuous improvements in terms of the material characteristics and fabrication process to realize multi-layer fine pattern interconnects and small form factor. We present the advanced coreless laminate substrates in this paper including 3-layer thin substrate built by ETS (Embedded Trace Substrate) technology, 3-layer SUTC (Simmtech Ultra-Thin substrate with Carrier) for fan-out chip last package, and 3-layer coreless substrate with HSR (High modulus Solder Resist) for reduced warpage. We also present new coreless substrates up to 10 layers and substrate based on EMC. These new laminate substrates are used in many different applications such as application processors, memory, CMOS image sensors, touch screen controllers, MEMS, and RF SIP(System in Package) for over 70GHz applications. One common challenge for all these substrates is to minimize the warpage. The analysis and simulation techniques for the warpage control are presented.","PeriodicalId":6846,"journal":{"name":"2017 China Semiconductor Technology International Conference (CSTIC)","volume":"41 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Technology advancement of laminate substrates for mobile, iot, and automotive applications\",\"authors\":\"Ken Lee, Min Sung Kim, Peter Shim, Ica Han, Jack Lee, Jeffery Chun, Samuel Cha\",\"doi\":\"10.1109/CSTIC.2017.7919867\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The increasing level of integration in electronic devices requires high density package substrates with good electrical and thermal performance, and high reliability. Organic laminate substrates have been serving these requirements with their continuous improvements in terms of the material characteristics and fabrication process to realize multi-layer fine pattern interconnects and small form factor. We present the advanced coreless laminate substrates in this paper including 3-layer thin substrate built by ETS (Embedded Trace Substrate) technology, 3-layer SUTC (Simmtech Ultra-Thin substrate with Carrier) for fan-out chip last package, and 3-layer coreless substrate with HSR (High modulus Solder Resist) for reduced warpage. We also present new coreless substrates up to 10 layers and substrate based on EMC. These new laminate substrates are used in many different applications such as application processors, memory, CMOS image sensors, touch screen controllers, MEMS, and RF SIP(System in Package) for over 70GHz applications. One common challenge for all these substrates is to minimize the warpage. The analysis and simulation techniques for the warpage control are presented.\",\"PeriodicalId\":6846,\"journal\":{\"name\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"volume\":\"41 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSTIC.2017.7919867\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2017.7919867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

电子器件的集成化水平不断提高,需要高密度的封装基板,具有良好的电气和热性能,以及高可靠性。有机层压基板在材料特性和制造工艺方面不断改进,以实现多层精细互连和小尺寸,从而满足了这些要求。我们在本文中介绍了先进的无芯层压基板,包括采用ETS(嵌入式跟踪基板)技术构建的3层薄基板,用于扇出芯片最后封装的3层SUTC(带载波的Simmtech超薄基板),以及用于减少翘曲的3层无芯基板(高模量阻焊剂)。我们还提出了多达10层的新型无芯基板和基于EMC的基板。这些新的层压板基板用于许多不同的应用,如应用处理器、存储器、CMOS图像传感器、触摸屏控制器、MEMS和用于超过70GHz应用的RF SIP(System in Package)。所有这些基板的一个共同挑战是尽量减少翘曲。介绍了翘曲控制的分析与仿真技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Technology advancement of laminate substrates for mobile, iot, and automotive applications
The increasing level of integration in electronic devices requires high density package substrates with good electrical and thermal performance, and high reliability. Organic laminate substrates have been serving these requirements with their continuous improvements in terms of the material characteristics and fabrication process to realize multi-layer fine pattern interconnects and small form factor. We present the advanced coreless laminate substrates in this paper including 3-layer thin substrate built by ETS (Embedded Trace Substrate) technology, 3-layer SUTC (Simmtech Ultra-Thin substrate with Carrier) for fan-out chip last package, and 3-layer coreless substrate with HSR (High modulus Solder Resist) for reduced warpage. We also present new coreless substrates up to 10 layers and substrate based on EMC. These new laminate substrates are used in many different applications such as application processors, memory, CMOS image sensors, touch screen controllers, MEMS, and RF SIP(System in Package) for over 70GHz applications. One common challenge for all these substrates is to minimize the warpage. The analysis and simulation techniques for the warpage control are presented.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Wafer size MOS2 with few monolayer synthesized by H2S sulfurization A fast and low-cost TSV/TGV filling method Finger print sensor molding thickness none destructive measurement with Terahertz technology Research of SMO process to improve the imaging capability of lithography system for 28nm node and beyond The study on the moldability and reliability of epoxy molding compound
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1