通过基于值的正确性关键性来确定验证的优先级

Joonhyuk Yoo, M. Franklin
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引用次数: 1

摘要

由于目前半导体技术的规模化趋势,微处理器变得越来越容易受到软错误的影响。传统的冗余多线程架构通过重新执行所有的计算来提供良好的容错性。但是,这样的完全重新执行会显著增加对处理器资源的需求,从而导致严重的性能下降。为了解决这一问题,本文引入了一种基于正确性临界度的过滤器检查器,对验证候选者进行优先级排序,从而有选择地进行验证。二进制正确性关键性(BCC)和正确性关键性可能性(LoCC)是分别量化一条指令对可靠性是否重要或一条指令对正确性关键性的可能性有多大的度量。正确临界性的可能性是通过脆弱性因子的值来计算的,脆弱性因子由用于计算结果的数字有效位宽度来定义。该技术是通过利用压缩计算有用数据位的信息冗余来实现的。基于正确性临界性测试的可能性,过滤器检查器通过绕过对正确执行不重要的指令来减轻验证工作负载。大量的测量证明,LoCC度量产生了相当广泛的值分布,表明它具有区分不同程度的正确性临界性的潜力。实验结果表明,该方案将传统的全容错处理器的速度提高了1.7倍,将软错误率降低到非容错处理器的18%。
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Prioritizing verification via value-based correctness criticality
Microprocessors are becoming increasingly susceptible to soft errors due to the current trends of semiconductor technology scaling. Traditional redundant multi-threading architectures provide good fault tolerance by re-executing all the computations. However, such a full re-execution significantly increases the demand on the processor resources, resulting in severe performance degradation. To address this problem, this paper introduces a correctness criticality based filter checker, which prioritizes the verification candidates so as to selectively do verification. Binary Correctness Criticality (BCC) and Likelihood of Correctness Criticality (LoCC) are metrics that quantify whether an instruction is important for reliability or how likely an instruction is correctness-critical, respectively. A likelihood of correctness criticality is computed by a value vulnerability factor, which is defined by the numerically significant bit-width used to compute a result. The proposed technique is accomplished by exploiting information redundancy of compressing computationally useful data bits. Based on the likelihood of correctness criticality test, the filter checker mitigates the verification workload by bypassing instructions that are unimportant for correct execution. Extensive measurements prove that the LoCC metric yields quite a wide distribution of values, indicating that it has the potential to differentiate diverse degrees of correctness criticality. Experimental results show that the proposed scheme accelerates a traditional fully-fault-tolerant processor by 1.7 times, while it reduces the soft error rate to 18% of that of a non-fault-tolerant processor.
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