J. Knechtel, O. Sinanoglu, I. Elfadel, J. Lienig, C. Sze
{"title":"大规模3D芯片:设计自动化、测试和可信赖集成的挑战和解决方案","authors":"J. Knechtel, O. Sinanoglu, I. Elfadel, J. Lienig, C. Sze","doi":"10.2197/IPSJTSLDM.10.45","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":38964,"journal":{"name":"IPSJ Transactions on System LSI Design Methodology","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"Large-Scale 3D Chips: Challenges and Solutions for Design Automation, Testing, and Trustworthy Integration\",\"authors\":\"J. Knechtel, O. Sinanoglu, I. Elfadel, J. Lienig, C. Sze\",\"doi\":\"10.2197/IPSJTSLDM.10.45\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":38964,\"journal\":{\"name\":\"IPSJ Transactions on System LSI Design Methodology\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IPSJ Transactions on System LSI Design Methodology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2197/IPSJTSLDM.10.45\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IPSJ Transactions on System LSI Design Methodology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2197/IPSJTSLDM.10.45","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}