{"title":"芯片内光互连中的电气隔离和风扇输出","authors":"A. Pappu, A. Apsel","doi":"10.1109/ISCAS.2004.1329326","DOIUrl":null,"url":null,"abstract":"In this paper, we calculate the benefits of electrical isolation for intra-chip optical interconnects. We compare the delay and energy metrics of systems with intra-chip electrical and optical fanout, and from the results obtained, we conclude that optical fanout can be used to improve speeds in electrical fanout systems even at very short on-chip distances.","PeriodicalId":6445,"journal":{"name":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","volume":"54 1","pages":"II-533"},"PeriodicalIF":0.0000,"publicationDate":"2004-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Electrical isolation and fanout in intra-chip optical interconnects\",\"authors\":\"A. Pappu, A. Apsel\",\"doi\":\"10.1109/ISCAS.2004.1329326\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we calculate the benefits of electrical isolation for intra-chip optical interconnects. We compare the delay and energy metrics of systems with intra-chip electrical and optical fanout, and from the results obtained, we conclude that optical fanout can be used to improve speeds in electrical fanout systems even at very short on-chip distances.\",\"PeriodicalId\":6445,\"journal\":{\"name\":\"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)\",\"volume\":\"54 1\",\"pages\":\"II-533\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-05-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISCAS.2004.1329326\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISCAS.2004.1329326","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electrical isolation and fanout in intra-chip optical interconnects
In this paper, we calculate the benefits of electrical isolation for intra-chip optical interconnects. We compare the delay and energy metrics of systems with intra-chip electrical and optical fanout, and from the results obtained, we conclude that optical fanout can be used to improve speeds in electrical fanout systems even at very short on-chip distances.