{"title":"光化学法沉积硫化铅薄膜的研究","authors":"T. Shyju, R. Gopalakrishnan","doi":"10.1109/ICANMEET.2013.6609311","DOIUrl":null,"url":null,"abstract":"Nanocrystalline lead sulphide (PbS) thin films were deposited on glass and ITO coated glass substrates by photochemical method. To improve the adhesive nature and properties the films were deposited on ITO coated substrate using photochemical deposition. The deposited films were characterized to study their structural, morphological and electrical properties. The photochemically deposited PbS thin films possess tetragonal system. The dislocation densities of the deposited thin films were evaluated from the X-ray diffraction data. High Resolution Scanning Electron Micrographs of the deposited film shows the oval shape arrangement of particles. The elemental composition of the film was confirmed by Energy Dispersive X-ray analysis. Hall measurements were carried out for the films and their electrical parameters were evaluated. The as-deposited PbS films have positive Hall coefficient, which confirms p-type conductivity.","PeriodicalId":13708,"journal":{"name":"International Conference on Advanced Nanomaterials & Emerging Engineering Technologies","volume":"102 1","pages":"340-343"},"PeriodicalIF":0.0000,"publicationDate":"2013-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Studies on lead sulphide thin films deposited by photochemical method\",\"authors\":\"T. Shyju, R. Gopalakrishnan\",\"doi\":\"10.1109/ICANMEET.2013.6609311\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Nanocrystalline lead sulphide (PbS) thin films were deposited on glass and ITO coated glass substrates by photochemical method. To improve the adhesive nature and properties the films were deposited on ITO coated substrate using photochemical deposition. The deposited films were characterized to study their structural, morphological and electrical properties. The photochemically deposited PbS thin films possess tetragonal system. The dislocation densities of the deposited thin films were evaluated from the X-ray diffraction data. High Resolution Scanning Electron Micrographs of the deposited film shows the oval shape arrangement of particles. The elemental composition of the film was confirmed by Energy Dispersive X-ray analysis. Hall measurements were carried out for the films and their electrical parameters were evaluated. The as-deposited PbS films have positive Hall coefficient, which confirms p-type conductivity.\",\"PeriodicalId\":13708,\"journal\":{\"name\":\"International Conference on Advanced Nanomaterials & Emerging Engineering Technologies\",\"volume\":\"102 1\",\"pages\":\"340-343\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-07-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Conference on Advanced Nanomaterials & Emerging Engineering Technologies\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICANMEET.2013.6609311\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Advanced Nanomaterials & Emerging Engineering Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICANMEET.2013.6609311","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Studies on lead sulphide thin films deposited by photochemical method
Nanocrystalline lead sulphide (PbS) thin films were deposited on glass and ITO coated glass substrates by photochemical method. To improve the adhesive nature and properties the films were deposited on ITO coated substrate using photochemical deposition. The deposited films were characterized to study their structural, morphological and electrical properties. The photochemically deposited PbS thin films possess tetragonal system. The dislocation densities of the deposited thin films were evaluated from the X-ray diffraction data. High Resolution Scanning Electron Micrographs of the deposited film shows the oval shape arrangement of particles. The elemental composition of the film was confirmed by Energy Dispersive X-ray analysis. Hall measurements were carried out for the films and their electrical parameters were evaluated. The as-deposited PbS films have positive Hall coefficient, which confirms p-type conductivity.