{"title":"PiN:片上网络的处理","authors":"Zhonghai Lu","doi":"10.1109/MDAT.2023.3307943","DOIUrl":null,"url":null,"abstract":"Editor’s notes: The author in this article advocates for Processing in NoC (PiN) as a means to actively engage a Network-on-Chip (NoC) in computation. The article highlights the benefits of utilizing the communication network for system-level performance enhancement, with a case study demonstrating its advantages over conventional passive NoC approaches. —Mahdi Nikdast, Colorado State University, USA —Miquel Moreto, Barcelona Supercomputing Center, Spain —Masoumeh (Azin) Ebrahimi, KTH Royal Institute of Technology, Sweden —Sujay Deb, IIIT Delhi, India","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"60 1","pages":"30-38"},"PeriodicalIF":1.9000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PiN: Processing in Network-on-Chip\",\"authors\":\"Zhonghai Lu\",\"doi\":\"10.1109/MDAT.2023.3307943\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Editor’s notes: The author in this article advocates for Processing in NoC (PiN) as a means to actively engage a Network-on-Chip (NoC) in computation. The article highlights the benefits of utilizing the communication network for system-level performance enhancement, with a case study demonstrating its advantages over conventional passive NoC approaches. —Mahdi Nikdast, Colorado State University, USA —Miquel Moreto, Barcelona Supercomputing Center, Spain —Masoumeh (Azin) Ebrahimi, KTH Royal Institute of Technology, Sweden —Sujay Deb, IIIT Delhi, India\",\"PeriodicalId\":48917,\"journal\":{\"name\":\"IEEE Design & Test\",\"volume\":\"60 1\",\"pages\":\"30-38\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/MDAT.2023.3307943\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MDAT.2023.3307943","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Editor’s notes: The author in this article advocates for Processing in NoC (PiN) as a means to actively engage a Network-on-Chip (NoC) in computation. The article highlights the benefits of utilizing the communication network for system-level performance enhancement, with a case study demonstrating its advantages over conventional passive NoC approaches. —Mahdi Nikdast, Colorado State University, USA —Miquel Moreto, Barcelona Supercomputing Center, Spain —Masoumeh (Azin) Ebrahimi, KTH Royal Institute of Technology, Sweden —Sujay Deb, IIIT Delhi, India
期刊介绍：
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.
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