250Mb/s至3Gb/s单侧连续速率CDR,采用精密频率检测器和1/5速率线性相位检测器

N. Trung, P. Häfliger
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引用次数: 0

摘要

本文介绍了台积电90nm CMOS工艺中250-Mb/s至3Gb/s连续速率时钟和数据恢复(CDR)电路。该电路首先在广泛的数据速率范围内从位序列27−1伪随机二进制序列(PRBS)中恢复精确的时钟频率。因此,对于相位检测的第二步,环路带宽和锁定范围的要求要宽松得多,实现为1/5速率线性相位检测器(PD),提供降低的时钟工作频率和低抖动。在布局后仿真中,CDR在2.5Gb/s的速度下实现了12.6 ps的峰对峰抖动,消耗了3.84mA的电流。
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250Mb/s to 3Gb/s unilateral continuous rate CDR using precise frequency detector and 1/5-rate linear phase detector
This paper describes a 250-Mb/s to 3Gb/s continuous rate clock and data recovery (CDR) circuit in the TSMC 90nm CMOS process. The circuit first recovers the precise clock frequency from bit-serial 27−1 pseudorandom binary-sequences (PRBS) across a wide range of data rates. Thus, the requirements for loop bandwidth and locking range is much relaxed for the second step of phase detection, implemented as a 1/5 rate linear phase detector (PD) offering reduced clock operating frequency and low jitter. The CDR achieves 12.6-ps peak-to-peak jitter at 2.5Gb/s and consumes a current of 3.84mA in post-layout simulation.
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