{"title":"毫米波介电常数和磁导率测量新技术","authors":"V. Apletalin, Y. Kazantsev, V. Solosin, A. Zubov","doi":"10.1109/ICIMW.2004.1422123","DOIUrl":null,"url":null,"abstract":"A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.","PeriodicalId":13627,"journal":{"name":"Infrared and Millimeter Waves, Conference Digest of the 2004 Joint 29th International Conference on 2004 and 12th International Conference on Terahertz Electronics, 2004.","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2004-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new technique for permittivity and permeability measurements at millimeter waves\",\"authors\":\"V. Apletalin, Y. Kazantsev, V. Solosin, A. Zubov\",\"doi\":\"10.1109/ICIMW.2004.1422123\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.\",\"PeriodicalId\":13627,\"journal\":{\"name\":\"Infrared and Millimeter Waves, Conference Digest of the 2004 Joint 29th International Conference on 2004 and 12th International Conference on Terahertz Electronics, 2004.\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared and Millimeter Waves, Conference Digest of the 2004 Joint 29th International Conference on 2004 and 12th International Conference on Terahertz Electronics, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIMW.2004.1422123\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared and Millimeter Waves, Conference Digest of the 2004 Joint 29th International Conference on 2004 and 12th International Conference on Terahertz Electronics, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIMW.2004.1422123","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new technique for permittivity and permeability measurements at millimeter waves
A new technique is proposed to determine the permittivity and permeability of planar samples at millimeter wavelengths. The values of /spl epsiv/ and /spl mu/ are determined from the measurement of power reflected from the system planar specimen + metallic reflector for various positions of the reflector. The technique is realized using the precise quasioptical reflectometer.
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