利用光致发光技术研究n型和p型3C - SiC的深层电子能级

{"title":"利用光致发光技术研究n型和p型3C - SiC的深层电子能级","authors":"Martin Wilhelm ., Mikael Syväjärvi ., Peter J. Wellmann .","doi":"10.5185/amp.2017/415/","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":7297,"journal":{"name":"Advanced Materials Proceedings","volume":"7 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of deep electronic levels in n‐type and p‐type 3C‐SiC using photoluminescence\",\"authors\":\"Martin Wilhelm ., Mikael Syväjärvi ., Peter J. Wellmann .\",\"doi\":\"10.5185/amp.2017/415/\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":7297,\"journal\":{\"name\":\"Advanced Materials Proceedings\",\"volume\":\"7 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Advanced Materials Proceedings\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.5185/amp.2017/415/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Materials Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5185/amp.2017/415/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}