Tamir Bendory, Ti-Yen Lan, Nicholas F Marshall, Iris Rukshin, Amit Singer
{"title":"多目标旋转探测","authors":"Tamir Bendory, Ti-Yen Lan, Nicholas F Marshall, Iris Rukshin, Amit Singer","doi":"10.3934/ipi.2022046","DOIUrl":null,"url":null,"abstract":"<p><p>We consider the multi-target detection problem of estimating a two-dimensional target image from a large noisy measurement image that contains many randomly rotated and translated copies of the target image. Motivated by single-particle cryo-electron microscopy, we focus on the low signal-to-noise regime, where it is difficult to estimate the locations and orientations of the target images in the measurement. Our approach uses autocorrelation analysis to estimate rotationally and translationally invariant features of the target image. We demonstrate that, regardless of the level of noise, our technique can be used to recover the target image when the measurement is sufficiently large.</p>","PeriodicalId":35587,"journal":{"name":"Transactions Hong Kong Institution of Engineers","volume":"19 1","pages":"362-380"},"PeriodicalIF":0.0000,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11340853/pdf/","citationCount":"0","resultStr":"{\"title\":\"MULTI-TARGET DETECTION WITH ROTATIONS.\",\"authors\":\"Tamir Bendory, Ti-Yen Lan, Nicholas F Marshall, Iris Rukshin, Amit Singer\",\"doi\":\"10.3934/ipi.2022046\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>We consider the multi-target detection problem of estimating a two-dimensional target image from a large noisy measurement image that contains many randomly rotated and translated copies of the target image. Motivated by single-particle cryo-electron microscopy, we focus on the low signal-to-noise regime, where it is difficult to estimate the locations and orientations of the target images in the measurement. Our approach uses autocorrelation analysis to estimate rotationally and translationally invariant features of the target image. We demonstrate that, regardless of the level of noise, our technique can be used to recover the target image when the measurement is sufficiently large.</p>\",\"PeriodicalId\":35587,\"journal\":{\"name\":\"Transactions Hong Kong Institution of Engineers\",\"volume\":\"19 1\",\"pages\":\"362-380\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11340853/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Transactions Hong Kong Institution of Engineers\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3934/ipi.2022046\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Transactions Hong Kong Institution of Engineers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3934/ipi.2022046","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}
We consider the multi-target detection problem of estimating a two-dimensional target image from a large noisy measurement image that contains many randomly rotated and translated copies of the target image. Motivated by single-particle cryo-electron microscopy, we focus on the low signal-to-noise regime, where it is difficult to estimate the locations and orientations of the target images in the measurement. Our approach uses autocorrelation analysis to estimate rotationally and translationally invariant features of the target image. We demonstrate that, regardless of the level of noise, our technique can be used to recover the target image when the measurement is sufficiently large.