利用像差校正STEM技术表征外延结构的原子分辨率

{"title":"利用像差校正STEM技术表征外延结构的原子分辨率","authors":"C. Hsiao","doi":"10.4172/2324-8777-c3-027","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":16457,"journal":{"name":"Journal of Nanomaterials & Molecular Nanotechnology","volume":"44 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2018-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Atomic resolution characterization of epitaxial structure by using aberration-corrected STEM\",\"authors\":\"C. Hsiao\",\"doi\":\"10.4172/2324-8777-c3-027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":16457,\"journal\":{\"name\":\"Journal of Nanomaterials & Molecular Nanotechnology\",\"volume\":\"44 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Nanomaterials & Molecular Nanotechnology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.4172/2324-8777-c3-027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nanomaterials & Molecular Nanotechnology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.4172/2324-8777-c3-027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}