电子束辐照用于航天器部件微生物还原

E. Urgiles, J. Wilcox, O. Montes, S. Osman, K. Venkateswaran, M. Cepeda, J. Maxim, L. Braby, S. Pillai
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引用次数: 18

摘要

最高程度的行星保护(PP)适用于着陆的行星任务和样本返回任务。到目前为止,干热微生物还原(DHMR)处理是NASA唯一批准的PP技术,可以满足生命探测任务严格的无菌要求,并防止前方污染。然而,航天器(s/c)和有效载荷是由一系列不同的人造材料和部件组成的,其中一些与DHMR不兼容。因此,NASA已经开始研究几种与DHMR互补的灭菌技术。在这里,我们报告了我们在美国宇航局火星探测计划(MEP'03)奖资助的电子束(电子束)辐照技术有效性的研究进展。使用深穿透(几厘米)高能(10兆电子伏)电子的电子束辐照是一种成熟的方法,用于使用线性加速器对大量食品进行灭菌。相比之下,低能量(100 keV)的电子将能量储存在大约50微米的范围内,与细菌孢子的规模相当(通常是几微米)。穿透深度和孢子大小之间的匹配使得“低能”电子照射对表面杀菌非常有效。电子束辐照是非接触的,没有残留物,并且正如我们的初步结果表明,与许多s/c材料兼容。二次污染通常是不可避免的,因为预灭菌的s/c部件再次用于功能测试和重新组装,需要重新应用灭菌处理。100千伏特的电子源足够小,因此它可以便携式,这将使它适合于局部治疗,以前灭菌的零件和子系统。
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Electron beam Irradiation for Microbial Reduction on Spacecraft Components
The highest degree of Planetary Protection (PP) applies to landed planetary missions and sample return missions. To date, Dry Heat Microbial Reduction (DHMR) treatment is the only NASA approved PP technique for meeting the stringent sterility requirements for life detection missions and to prevent forward contamination. However, spacecraft (s/c) and payloads are made up of a diverse set of man-made materials and components, some of which are incompatible with DHMR. NASA has therefore begun investigating several complementary sterilization techniques to DHMR. Here, we report on our progress in the investigation of the effectiveness of electron beam (e-beam) irradiation technique funded by a NASA Mars Exploration Program (MEP'03) award. E-beam irradiation using deep penetrating (several centimeters) high-energy (10 MeV) electrons is a well-developed method used for sterilization of food products in bulk quantities using linear accelerators. In contrast, low-energy (100 keV) electrons deposit their energy into about 50 micrometers, comparable to the scale of bacterial spores (typically several micrometers). The match between the depth of the penetration and spore size makes the "low-energy" electron irradiation extremely efficient for surface sterilization. E-beam irradiation is non-contact, leaves no residues, and as our preliminary results indicate is compatible with many s/c materials. Secondary contamination is often unavoidable since pre-sterilized s/c parts are used again for functional testing and re-assembly, necessitating reapplication of sterilization treatment. The 100 keV electron source is sufficiently small so that it could be made portable, which would make it suited for treatment localized, previously sterilized parts and subsystems.
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