{"title":"结合表面表征技术分析基体粗糙度","authors":"Shumin Zhang, Zhanshan Wang, Zhengxiang Shen, Wenjuan Wu, Long Chen","doi":"10.1007/978-1-4020-6018-2_69","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":19528,"journal":{"name":"Optical Instruments","volume":"20 1","pages":"541-545"},"PeriodicalIF":0.0000,"publicationDate":"2007-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Combination of Surface Characterization Techniques for Analyzing the Roughness of the Substrate\",\"authors\":\"Shumin Zhang, Zhanshan Wang, Zhengxiang Shen, Wenjuan Wu, Long Chen\",\"doi\":\"10.1007/978-1-4020-6018-2_69\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":19528,\"journal\":{\"name\":\"Optical Instruments\",\"volume\":\"20 1\",\"pages\":\"541-545\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Instruments\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.1007/978-1-4020-6018-2_69\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Instruments","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1007/978-1-4020-6018-2_69","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0