{"title":"绝缘材料快速热耐久方法的理论分析","authors":"Z. Yingsuo, Bai Yi","doi":"10.1109/CEIDP.1989.69543","DOIUrl":null,"url":null,"abstract":"The authors show by analysis and examples that the rapid thermal endurance testing methods of insulating materials are all approximate and simulations, in spite of the fact that some seem to have a strictly mathematical derivation or theoretical demonstration. It is suggested that the merits of the rapid methods should be evaluated by comparing test results with conventional aging.<<ETX>>","PeriodicalId":10719,"journal":{"name":"Conference on Electrical Insulation and Dielectric Phenomena,","volume":"15 1","pages":"180-185"},"PeriodicalIF":0.0000,"publicationDate":"1989-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Theoretical analysis for rapid thermal endurance methods of insulating materials\",\"authors\":\"Z. Yingsuo, Bai Yi\",\"doi\":\"10.1109/CEIDP.1989.69543\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors show by analysis and examples that the rapid thermal endurance testing methods of insulating materials are all approximate and simulations, in spite of the fact that some seem to have a strictly mathematical derivation or theoretical demonstration. It is suggested that the merits of the rapid methods should be evaluated by comparing test results with conventional aging.<<ETX>>\",\"PeriodicalId\":10719,\"journal\":{\"name\":\"Conference on Electrical Insulation and Dielectric Phenomena,\",\"volume\":\"15 1\",\"pages\":\"180-185\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference on Electrical Insulation and Dielectric Phenomena,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP.1989.69543\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference on Electrical Insulation and Dielectric Phenomena,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1989.69543","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Theoretical analysis for rapid thermal endurance methods of insulating materials
The authors show by analysis and examples that the rapid thermal endurance testing methods of insulating materials are all approximate and simulations, in spite of the fact that some seem to have a strictly mathematical derivation or theoretical demonstration. It is suggested that the merits of the rapid methods should be evaluated by comparing test results with conventional aging.<>