S. Prajapati, Bhupendra Singh, B. Singh, X. Llovet, R. Shanker
{"title":"纯厚Cu (Z=29)靶上10- 25kev电子轫致辐射的Kα,β x射线强度比与角和冲击能的关系","authors":"S. Prajapati, Bhupendra Singh, B. Singh, X. Llovet, R. Shanker","doi":"10.1063/1.5122519","DOIUrl":null,"url":null,"abstract":"The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.","PeriodicalId":7262,"journal":{"name":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","volume":"154 8 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Angular and impact energy dependence of intensity ratio of Kα,β x-rays to bremsstrahlung radiation emitted from 10-25 keV electrons incident on a pure thick Cu (Z=29) target\",\"authors\":\"S. Prajapati, Bhupendra Singh, B. Singh, X. Llovet, R. Shanker\",\"doi\":\"10.1063/1.5122519\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.\",\"PeriodicalId\":7262,\"journal\":{\"name\":\"ADVANCES IN BASIC SCIENCE (ICABS 2019)\",\"volume\":\"154 8 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ADVANCES IN BASIC SCIENCE (ICABS 2019)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1063/1.5122519\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.5122519","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Angular and impact energy dependence of intensity ratio of Kα,β x-rays to bremsstrahlung radiation emitted from 10-25 keV electrons incident on a pure thick Cu (Z=29) target
The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.The variation of relative intensity ratios of the characteristic K x-ray lines, namely, Kα and Kβ to that of the underneath BS radiation as a function of incidence angle 15°-75° under bombardment of 10-25 keV-electrons on a pure thick target of polycrystalline Cu (Z=29) in the reflection geometry mode using a Si PIN photodiode detector has been studied. The comparison of experimental results with those of MC simulations using PENELOPE code shows a good agreement between experiment and theory within the error of measurements for both angular and energy dependence of the considered ratios. The details of these results are presented and discussed in this work.