氨和等离子体的特性有助于MBE生长,用于先进纳米电子学的iii -氮化物异质结构的开发和生产

A. N. Alexeev, D. M. Krasovitsky, S. I. Petrov, V. P. Chaly, V. V. Mamaev
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引用次数: 0

摘要

本文介绍了两种MBE(利用氮和氨的等离子体活化)使用STE3N MBE系统生长GaN纳米异质结构的结果。结果表明,使用在极高温度(高达1150℃)下用氨生长的高温AlN/AlGaN缓冲层可以显著改善GaN层的结构质量,并将位错密度降低到9.108 - 1.109 cm-2。另一方面,与氨MBE不同,氨MBE在T < 500°C时难以使用(因为氨的分解效率低),PA-MBE在低温下非常有效,例如用于生长与GaN晶格匹配的InAlN层。用PA-MBE和NH3-MBE(在极高的氨通量下)生长出了高质量的GaN/InAlN异质结构。演示了在Svetlana-Rost JSC中使用SemiTEq设备用于基于GaN的高功率微波场效应管。
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Features of ammonia and plasma assisted MBE growth for development and production of III-nitrides based heterostructures for advanced nanoelectronics
The results of use of STE3N MBE System for growth of GaN nanoheterostructures by both types of MBE (using plasma activation of nitrogen and ammonia) are presented. It is shown that the use of high-temperature AlN/AlGaN buffer layers grown using ammonia at extremely high temperatures (up to 1150°C) allows improving drastically the structural quality of the GaN layers and reducing the dislocation density down to 9·108-1·109 cm-2. On the other hand, unlike the ammonia MBE, which is difficult to use at T <;500°C (because of low decomposition efficiency of ammonia), PA-MBE is very effective at low temperatures, for example for growth of InAlN layers lattice-matched to GaN. The results of the growth of high quality GaN/InAlN heterostructures using both PA-MBE and NH3-MBE (at extremely high ammonia flux) are shown. The use of SemiTEq equipment in Svetlana-Rost JSC for high power microwave FETs based on GaN is demonstrated.
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