{"title":"三维堆叠封装器件失效分析中的热力学分析","authors":"Xu Wang, Zhimin Ding, Chao Duan, Meng Meng, Yudong Liu, Zhibin Wang, Xiangtian Yu","doi":"10.1109/ICICM54364.2021.9660285","DOIUrl":null,"url":null,"abstract":"Three-dimensional(3D) stacked packaging devices use epoxy packaging materials to integrate multiple components or chips in the vertical direction, and adopt various new interconnection technologies to realize the vertical interconnection of components. This article introduces a case of cracking on the surface coating of a 3D stacked package component with a vertical electrical connection by the surface metal coating. Through the analysis of the stacked packaging material and discussion of the process, the failure mechanism is clearly obtained and the cause of the failure was found out. Finally, several quality assurance methods to ensure the epoxy curing quality of epoxy-encapsulated 3D devices are given.","PeriodicalId":6693,"journal":{"name":"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"92 1","pages":"137-141"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Thermodynamic Analysis in Failure Analysis of 3D Stacked Package Devices\",\"authors\":\"Xu Wang, Zhimin Ding, Chao Duan, Meng Meng, Yudong Liu, Zhibin Wang, Xiangtian Yu\",\"doi\":\"10.1109/ICICM54364.2021.9660285\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Three-dimensional(3D) stacked packaging devices use epoxy packaging materials to integrate multiple components or chips in the vertical direction, and adopt various new interconnection technologies to realize the vertical interconnection of components. This article introduces a case of cracking on the surface coating of a 3D stacked package component with a vertical electrical connection by the surface metal coating. Through the analysis of the stacked packaging material and discussion of the process, the failure mechanism is clearly obtained and the cause of the failure was found out. Finally, several quality assurance methods to ensure the epoxy curing quality of epoxy-encapsulated 3D devices are given.\",\"PeriodicalId\":6693,\"journal\":{\"name\":\"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)\",\"volume\":\"92 1\",\"pages\":\"137-141\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICM54364.2021.9660285\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 6th International Conference on Integrated Circuits and Microsystems (ICICM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICM54364.2021.9660285","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Thermodynamic Analysis in Failure Analysis of 3D Stacked Package Devices
Three-dimensional(3D) stacked packaging devices use epoxy packaging materials to integrate multiple components or chips in the vertical direction, and adopt various new interconnection technologies to realize the vertical interconnection of components. This article introduces a case of cracking on the surface coating of a 3D stacked package component with a vertical electrical connection by the surface metal coating. Through the analysis of the stacked packaging material and discussion of the process, the failure mechanism is clearly obtained and the cause of the failure was found out. Finally, several quality assurance methods to ensure the epoxy curing quality of epoxy-encapsulated 3D devices are given.