{"title":"感应暂态测试在大型系统中的应用","authors":"T. Braxton","doi":"10.1109/ISEMC.1992.626074","DOIUrl":null,"url":null,"abstract":"Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"63 1","pages":"183-188"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Inductive-transient testing in large system applications\",\"authors\":\"T. Braxton\",\"doi\":\"10.1109/ISEMC.1992.626074\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"63 1\",\"pages\":\"183-188\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626074\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626074","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Inductive-transient testing in large system applications
Fast-transient immunity testing is defined in a number of ways. International Electrotechnical Commission document 801 -4 calls for EquipmentUnder-Test (EUT) cables to be induced with repetitive, well-defined pulses, This paper describes a large-system application in which a single circuit pack within the system was identified as being sensitive to random transients, and discusses the difjculty in repeatably testing for that sensitivity using 1EC 801-4 techniques. A successjiul alternative test was found using a chattering relay configuration, similar to that described in SAE standard Jlll3I12. This paper discusses the experience of those tests, and the insights that were gained in performing theam on this ELT.
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