采用先进电镀方法改进铜柱结构

Jong-Young Park, oung-Jae Kim, J. Noh, H. Honma
{"title":"采用先进电镀方法改进铜柱结构","authors":"Jong-Young Park, oung-Jae Kim, J. Noh, H. Honma","doi":"10.17265/2161-6221/2017.11-12.001","DOIUrl":null,"url":null,"abstract":"The recent appearance of mobile application processor now plays an important role in the semiconductor industry. Additionally, there have been endless demands for small form factor, thin profile, outstanding thermal, mechanical properties and electrical performances in the field of IC packages for mobile application processors. MIS (Molded Interconnect Substrate) can provide ideal and this solution in the mobile industry as it contains multiple solutions for the complicated requirement of the IC packages for application processors. Based on the embedded pattern technology, this solution can provide high I/O count, fine pattern for small form factor, and stable flip chip mounting methods. Other advantages of this solution include stable properties required for high-frequency transmission and high thermal dissipation rate as it is only composed of copper and epoxy mold compound materials. These core techniques for MIS technology can be divided into below major concepts. First, Cu pillar electrolytic plating technology electrically connects the inner and the outer layers using photo-lithography method, instead of laser method. The shape of Cu pillar and the plating thickness tolerance control are the key parameters. Second, grinding technology is to precisely grind the plated Cu pillars and applied mold epoxy. And deposition of Cu layer on top of grinded mold surface can construct fine pattern traces.","PeriodicalId":16171,"journal":{"name":"Journal of materials science & engineering","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2017-12-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Improvement of Cu-Pillar Structure Using Advanced Plating Method\",\"authors\":\"Jong-Young Park, oung-Jae Kim, J. Noh, H. Honma\",\"doi\":\"10.17265/2161-6221/2017.11-12.001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The recent appearance of mobile application processor now plays an important role in the semiconductor industry. Additionally, there have been endless demands for small form factor, thin profile, outstanding thermal, mechanical properties and electrical performances in the field of IC packages for mobile application processors. MIS (Molded Interconnect Substrate) can provide ideal and this solution in the mobile industry as it contains multiple solutions for the complicated requirement of the IC packages for application processors. Based on the embedded pattern technology, this solution can provide high I/O count, fine pattern for small form factor, and stable flip chip mounting methods. Other advantages of this solution include stable properties required for high-frequency transmission and high thermal dissipation rate as it is only composed of copper and epoxy mold compound materials. These core techniques for MIS technology can be divided into below major concepts. First, Cu pillar electrolytic plating technology electrically connects the inner and the outer layers using photo-lithography method, instead of laser method. The shape of Cu pillar and the plating thickness tolerance control are the key parameters. Second, grinding technology is to precisely grind the plated Cu pillars and applied mold epoxy. And deposition of Cu layer on top of grinded mold surface can construct fine pattern traces.\",\"PeriodicalId\":16171,\"journal\":{\"name\":\"Journal of materials science & engineering\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of materials science & engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.17265/2161-6221/2017.11-12.001\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of materials science & engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.17265/2161-6221/2017.11-12.001","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

最近出现的移动应用处理器在半导体产业中扮演着重要的角色。此外,在移动应用处理器的IC封装领域,对小尺寸,薄外形,出色的热,机械性能和电气性能的需求是无止境的。MIS(模制互连基板)可以为移动行业提供理想的解决方案,因为它包含了应用处理器IC封装的复杂要求的多种解决方案。该方案基于嵌入式模式技术,可以提供高I/O数、小尺寸的精细模式和稳定的倒装芯片安装方式。该解决方案的其他优点包括高频传输所需的稳定性能和高散热率,因为它仅由铜和环氧模复合材料组成。这些MIS技术的核心技术可以分为以下几个主要概念。首先,铜柱电解镀技术用光刻法代替激光法将内外层电连接。铜柱形状和镀层厚度公差控制是关键参数。二、研磨工艺是对镀铜柱进行精密研磨,并应用模具环氧树脂。在模具表面沉积Cu层可以形成精细的花纹痕迹。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Improvement of Cu-Pillar Structure Using Advanced Plating Method
The recent appearance of mobile application processor now plays an important role in the semiconductor industry. Additionally, there have been endless demands for small form factor, thin profile, outstanding thermal, mechanical properties and electrical performances in the field of IC packages for mobile application processors. MIS (Molded Interconnect Substrate) can provide ideal and this solution in the mobile industry as it contains multiple solutions for the complicated requirement of the IC packages for application processors. Based on the embedded pattern technology, this solution can provide high I/O count, fine pattern for small form factor, and stable flip chip mounting methods. Other advantages of this solution include stable properties required for high-frequency transmission and high thermal dissipation rate as it is only composed of copper and epoxy mold compound materials. These core techniques for MIS technology can be divided into below major concepts. First, Cu pillar electrolytic plating technology electrically connects the inner and the outer layers using photo-lithography method, instead of laser method. The shape of Cu pillar and the plating thickness tolerance control are the key parameters. Second, grinding technology is to precisely grind the plated Cu pillars and applied mold epoxy. And deposition of Cu layer on top of grinded mold surface can construct fine pattern traces.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Microstructured Optical Fibers Made of Chalcogenide Glass for the Generation of Optical Functions Investigation of Striations of Tellurium Inclusion in (Cd,Zn)Te Crystals Grown by Travelling Heater Method Modeling and Simulation of ΔH in Solid State Synthesis of Nanocomposites Al-Cu-Zr Creative Economy and Materials Science & Engineering Effect of Universal Primers on the Tensile Bond Strength between Zirconia and Resin Composites
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1