{"title":"热脉冲用于中厚绝缘样品空间电荷测量的考虑","authors":"Sneha Satish Hegde, P. Notingher, J. Laurentie","doi":"10.1109/CEIDP50766.2021.9705440","DOIUrl":null,"url":null,"abstract":"In this paper, the responses to the application of thermal pulses on space charge containing medium thickness polyethylene samples (50-100 µm) coated with thin and thick semicon electrodes is studied through simulations. Surface temperature, signal amplitude and signal dynamics are analyzed in order to assess the feasibility of experimental setups without affecting the state of the sample and also allowing high sensitivity/resolution measurements near the interface between a semiconductor layer and an insulating layer.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"236 1","pages":"643-646"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Considerations on using Thermal Pulses for Space Charge Measurements in Medium Thickness Insulating Samples\",\"authors\":\"Sneha Satish Hegde, P. Notingher, J. Laurentie\",\"doi\":\"10.1109/CEIDP50766.2021.9705440\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the responses to the application of thermal pulses on space charge containing medium thickness polyethylene samples (50-100 µm) coated with thin and thick semicon electrodes is studied through simulations. Surface temperature, signal amplitude and signal dynamics are analyzed in order to assess the feasibility of experimental setups without affecting the state of the sample and also allowing high sensitivity/resolution measurements near the interface between a semiconductor layer and an insulating layer.\",\"PeriodicalId\":6837,\"journal\":{\"name\":\"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"volume\":\"236 1\",\"pages\":\"643-646\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-12-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CEIDP50766.2021.9705440\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Considerations on using Thermal Pulses for Space Charge Measurements in Medium Thickness Insulating Samples
In this paper, the responses to the application of thermal pulses on space charge containing medium thickness polyethylene samples (50-100 µm) coated with thin and thick semicon electrodes is studied through simulations. Surface temperature, signal amplitude and signal dynamics are analyzed in order to assess the feasibility of experimental setups without affecting the state of the sample and also allowing high sensitivity/resolution measurements near the interface between a semiconductor layer and an insulating layer.
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