{"title":"基于双光子荧光热显微镜的集成电路热点检测","authors":"Guan-Yu Zhuo, Zu-Po Yang, M. Chan","doi":"10.1364/CLEO_AT.2018.JTU2A.93","DOIUrl":null,"url":null,"abstract":"For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.","PeriodicalId":6498,"journal":{"name":"2018 Conference on Lasers and Electro-Optics (CLEO)","volume":"67 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope\",\"authors\":\"Guan-Yu Zhuo, Zu-Po Yang, M. Chan\",\"doi\":\"10.1364/CLEO_AT.2018.JTU2A.93\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.\",\"PeriodicalId\":6498,\"journal\":{\"name\":\"2018 Conference on Lasers and Electro-Optics (CLEO)\",\"volume\":\"67 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 Conference on Lasers and Electro-Optics (CLEO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/CLEO_AT.2018.JTU2A.93\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 Conference on Lasers and Electro-Optics (CLEO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/CLEO_AT.2018.JTU2A.93","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope
For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
