Shili Huang, Haoran Wang, D. Kumar, G. Zhu, Huai Wang
{"title":"多小驱动器系统中直流电容寿命研究","authors":"Shili Huang, Haoran Wang, D. Kumar, G. Zhu, Huai Wang","doi":"10.1109/COBEP/SPEC44138.2019.9065455","DOIUrl":null,"url":null,"abstract":"This paper studies the reliability of DC-Link capacitor in multiple slim drives system. In order to obtain the electro-thermal stress of capacitor in individual drive simply and accurately, a time-efficient equivalent model and its analytical model for multiple slim drives system is proposed. Based on the proposed equivalent circuit model and the existing lifetime prediction method, the impact of drive numbers on the reliability of DC-link capacitor in multiple slim drives is analyzed. The results serve as a guideline for capacitor sizing in multiple slim drives system from reliability aspect.","PeriodicalId":69617,"journal":{"name":"电力电子","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Lifetime Investigation of DC-link Capacitors in Multiple Slim Drives System\",\"authors\":\"Shili Huang, Haoran Wang, D. Kumar, G. Zhu, Huai Wang\",\"doi\":\"10.1109/COBEP/SPEC44138.2019.9065455\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper studies the reliability of DC-Link capacitor in multiple slim drives system. In order to obtain the electro-thermal stress of capacitor in individual drive simply and accurately, a time-efficient equivalent model and its analytical model for multiple slim drives system is proposed. Based on the proposed equivalent circuit model and the existing lifetime prediction method, the impact of drive numbers on the reliability of DC-link capacitor in multiple slim drives is analyzed. The results serve as a guideline for capacitor sizing in multiple slim drives system from reliability aspect.\",\"PeriodicalId\":69617,\"journal\":{\"name\":\"电力电子\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"电力电子\",\"FirstCategoryId\":\"1093\",\"ListUrlMain\":\"https://doi.org/10.1109/COBEP/SPEC44138.2019.9065455\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"电力电子","FirstCategoryId":"1093","ListUrlMain":"https://doi.org/10.1109/COBEP/SPEC44138.2019.9065455","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Lifetime Investigation of DC-link Capacitors in Multiple Slim Drives System
This paper studies the reliability of DC-Link capacitor in multiple slim drives system. In order to obtain the electro-thermal stress of capacitor in individual drive simply and accurately, a time-efficient equivalent model and its analytical model for multiple slim drives system is proposed. Based on the proposed equivalent circuit model and the existing lifetime prediction method, the impact of drive numbers on the reliability of DC-link capacitor in multiple slim drives is analyzed. The results serve as a guideline for capacitor sizing in multiple slim drives system from reliability aspect.
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