{"title":"一种改进电磁干扰屏蔽预测的方法","authors":"C. Brench","doi":"10.1109/ISEMC.1992.626085","DOIUrl":null,"url":null,"abstract":"Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"232-235"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Method To Improve EMI Shielding Predictions\",\"authors\":\"C. Brench\",\"doi\":\"10.1109/ISEMC.1992.626085\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"17 1\",\"pages\":\"232-235\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1992.626085\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1992.626085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Colin E. Brench Digital Equipment Corporation 146 Main Street, Maynard, MA 01754 Overall perfonnance of a shield with one or more apertures depends upon a number of factors, including, the type and location of the source, the presence of adjacent conductors and the geometry of the shield. Both analytic and numerical techniques were employed in this work to analyze four separate indicators to shielding perfonnance. The four indicators used were shielding effectiveness, electric field suppression, magnetic field suppression and surface impedance.
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