C. Manoharan, G. Kiruthigaa, S. Dhanapandian, K. Kumar, M. Jothibas
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引用次数: 2
摘要
采用氯化锡与硫脲在275℃空气中固相反应制备了纳米SnS2薄片。采用x射线衍射(XRD)、能谱扫描电镜(SEM with EDS)、原子力显微镜(AFM)、紫外-可见吸收光谱和光致发光光谱对产物的结构和光学性质进行了表征。制备的样品的x射线衍射(XRD)图谱显示为SnS2的六方相,晶粒尺寸为21.12nm。能量色散x射线分析表明,元素比接近于二硫化锡(SnS2.04)的元素比。紫外可见光谱观察到吸收边出现蓝移,带隙为3.03eV。光致发光光谱显示两个强峰,对应于绿色和红色发射。
Preparation and characterization of nano structured SnS2 by solid state reaction method
Nanometer sized SnS2 flakes were prepared by solid state reaction between tin chloride and thiourea in air at 275°C. The structural and optical properties of the resultant products were characterized by means of X-ray diffraction (XRD), scanning electron microscopy with energy dispersive spectroscopy (SEM with EDS), atomic force microscopy (AFM), UV-Vis absorption and photoluminescence spectroscopy. The X-ray diffraction (XRD) pattern of the as-prepared sample was indexed to the hexagonal phase of SnS2 and the crystallite size was found to be 21.12nm. Energy dispersive X-ray analysis indicated that the elemental ratio was close to those for tin disulphide (SnS2.04). The blue shift in the absorption edge was observed from the UV-Vis spectrum and the band gap was found to be 3.03eV. The Photoluminescence spectra showed two strong peaks corresponding to green and red emission.