小型装配体高频振动应力消除研究

Wen He, Xiao-Yin Cheng, Runjie Shen
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引用次数: 9

摘要

为了消除小部件的残余应力,研究了一种高频振动应力消除方法。根据晶体位错理论对残余应力的微观来源进行了分析,发现不稳定位错的出现和局部能量集中是残余应力产生的主要原因。然后通过位错动力学模型研究了位错高频振动应力消除的机理,当工件在较高的谐振频率下受到激励时,位错上的微观晶粒会剧烈移动并回到原来的位置,从而使位错的数量越来越少,从而消除了残余应力。设计了一种消除小型焊接试样残余应力的实验方法。结果表明,小构件应力消除方法是有效的。金相分析也证明了该方法的作用机理。该方法对MEMS器件的应力消除具有重要作用
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Research on High-Frequency Vibratory Stress Relief for Small Assembly
To relieve the residual stress in small assembly, a method called high-frequency vibratory stress relief was researched. Microscopic origin of residual stress was analyzed according to the theory of crystal dislocation, which shows that the appeared unstable dislocations and localized energy concentrating are the main reason to produce residual stress. And then the mechanism of high frequency vibratory stress relief was studied through the dynamic model of dislocations, which is that the microscopic grains on the dislocations will move severely and go back to their original positions when the workpiece is excited at the higher resonant frequency, and thus the number of dislocations will become less and less so that residual stress is relieved. An experiment was designed to relieve the residual stress on a small welding specimen. The results prove that the method of stress relief on small-assembly is effective. Finally, the metallographic analysis also proves the mechanism of the method. The method could play an important role in the stress relief for MEMS devices
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