硅基阻塞杂质带检测器128×128低温读出电路的设计

Ying Li, Hong Ma, Xin Ge, Xiaowan Dai, Yongshan Hu, Yulu Chen, Xiaodong Wang
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引用次数: 0

摘要

本文采用0.18 m CMOS技术,开发了一种适用于硅基阻塞杂质带探测器的$128 \times128$低温读出电路,可在6K温度下使用。在参数提取和MOSFET低温模型建立的基础上,重点设计了像素电路和读出模式。在设计中,还采用了相关双采样技术来降低信道中产生的噪声。所设计的读出电路可以在室温和6K下工作,其中工作频率为1MHz,最大功耗为127.38mW,输出摆幅约为2V。
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Design of a 128×128 Cryogenic Readout Circuit for Silicon-based Blocked-impurity-band Detector
We have developed a $128 \times128$ cryogenic readout circuit suitable for Silicon-based Blocked-impurity-band detector by means of 0.18 m CMOS technology in this paper, which can be used at 6K temperature. Based on the extraction of parameters and the establishment of the cryogenic temperature model of MOSFET, we focus on the design of the pixel circuit and readout mode. In the design, the correlated double sampling technology is also used to reduce the noise generated in the channel. The designed readout circuit can work at both room temperature and 6K, where the working frequency is 1MHz, the maximum power consumption is 127.38mW, and the output swing is about 2V.
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