Au/Co/Si(100)超薄楔形膜的厚度依赖性结构和磁性能

J. Tripathi, Amit L. Sharma, R. Bisen, D. Kumar, M. Gupta, Prashant Gupta, S. Tripathi
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引用次数: 1

摘要

本文对离子束溅射技术制备超薄楔形薄膜进行了研究。该薄膜由Co超薄楔层(厚度为0.5nm-4nm)夹在一对Au层之间组成。报告了测量的厚度相关的结构和磁性能。在本工作中,对最低、中、最高厚度三个不同的位置进行了探测。x射线反射率测量揭示了Co和Au层混合的粗糙度。然而,没有观察到合金形成的迹象。x射线衍射测量显示了薄膜的多晶性质。由于磁性Co粒子的数量很少,在薄膜的最低厚度侧,磁滞回线不明显,但当厚度足够高时,显示出铁磁特性,则可以观察到清晰的铁磁磁滞回线,并且矫顽力随Co层厚度的增加而增加。总体结果可以用相邻Au层之间Co颗粒的生长来解释。本文对离子束溅射技术制备超薄楔形薄膜进行了研究。该薄膜由Co超薄楔层(厚度为0.5nm-4nm)夹在一对Au层之间组成。报告了测量的厚度相关的结构和磁性能。在本工作中,对最低、中、最高厚度三个不同的位置进行了探测。x射线反射率测量揭示了Co和Au层混合的粗糙度。然而,没有观察到合金形成的迹象。x射线衍射测量显示了薄膜的多晶性质。由于磁性Co粒子的数量很少,在薄膜的最低厚度侧,磁滞回线不明显,但当厚度足够高时,显示出铁磁特性,则可以观察到清晰的铁磁磁滞回线,并且矫顽力随Co层厚度的增加而增加。总体结果是……
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Thickness dependent structural and magnetic properties of Au/Co/Si (100) ultra-thin wedge film
In the present study, the investigations on an ultra thin wedge thin film prepared by Ion Beam Sputtering (IBS) technique are presented. This film consists of a Co ultrathin wedge layer (thickness ranging from 0.5nm-4nm) sandwiched between a pair of Au layers. The thickness dependent structural and magnetic properties measured are reported. Three different locations, the lowest, middle and the highest thickness were probed for the present work. The X-ray reflectivity measurements reveal roughness induced intermixing of Co and Au layers. However, no signature of alloy formation is observed. X-ray diffraction measurements show polycrystalline nature of film. The hysteresis loops are not properly seen on lowest thickness side of film due to very less number of magnetic Co particles, but when the thickness is high enough show the ferromagnetic character then clear ferromagnetic hysteresis loop is observed and the coercivity is seen to increase with increase in Co layer thickness. The overall results are interpreted in terms of growth of Co particles in between adjacent Au layers.In the present study, the investigations on an ultra thin wedge thin film prepared by Ion Beam Sputtering (IBS) technique are presented. This film consists of a Co ultrathin wedge layer (thickness ranging from 0.5nm-4nm) sandwiched between a pair of Au layers. The thickness dependent structural and magnetic properties measured are reported. Three different locations, the lowest, middle and the highest thickness were probed for the present work. The X-ray reflectivity measurements reveal roughness induced intermixing of Co and Au layers. However, no signature of alloy formation is observed. X-ray diffraction measurements show polycrystalline nature of film. The hysteresis loops are not properly seen on lowest thickness side of film due to very less number of magnetic Co particles, but when the thickness is high enough show the ferromagnetic character then clear ferromagnetic hysteresis loop is observed and the coercivity is seen to increase with increase in Co layer thickness. The overall results are inter...
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