一种基于445F2泄漏的物理不可克隆功能,通过重新映射实现物联网安全无损稳定

Jongmin Lee, Donghyeon Lee, Yongmin Lee, Yoonmyung Lee
{"title":"一种基于445F2泄漏的物理不可克隆功能,通过重新映射实现物联网安全无损稳定","authors":"Jongmin Lee, Donghyeon Lee, Yongmin Lee, Yoonmyung Lee","doi":"10.1109/ISSCC.2018.8310219","DOIUrl":null,"url":null,"abstract":"With the advent of the IoT era, billions of devices are connected to networks, and assuring sufficient security at low cost is a critical concern. Physically Unclonable Functions (PUFs) have drawn increasing attention as key security building blocks for authentication since each PUF circuit has unique challenge response pairs (CRPs). Such uniqueness is achieved by maximizing the effects of process variation using process-sensitive circuits, i.e. PUF cells. Recently reported PUF cell types include cells based on a two-transistor amplifier [1], NAND gate [2], ring oscillator [3], current mirror [4], back-to-back connected inverters [5], and inverter [6]. Regardless of the variation source, PUFs inevitably include CRPs that respond inconsistently when the process variation of the compared element in the CRP is small compared to noise. For example, if the output of a two-transistor amplifier in [1] is near the switching threshold, the output can be inconsistent, resulting in bit error and an unstable CRP. Thus, efforts have focused on stabilizing unstable CRPs. The most straightforward stabilization scheme is temporal majority voting (TMV) [1,5], but the improvement in bit error rate (BER) and stability is limited since it does not directly address the instability of a given CRP. Trimming [2,3,5,6], another widely used approach, improves BER/stability by discarding unstable CRPs. However, stability evaluation is not very accurate, so the number of discarded CRPs can be significant (up to 30% in [3]), increasing the required silicon area for additional CRP generation and making it prohibitive for cost-sensitive IoT applications. This is especially true for weak PUFs. In this paper, a leakage-based PUF that allows lossless stabilization through remapping of unstable PUF cell pairs is presented. BER and stability comparable to, or better than, trimming stabilization method are achieved without discarding CRPs.","PeriodicalId":6617,"journal":{"name":"2018 IEEE International Solid - State Circuits Conference - (ISSCC)","volume":"31 1","pages":"132-134"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"49","resultStr":"{\"title\":\"A 445F2 leakage-based physically unclonable Function with Lossless Stabilization Through Remapping for IoT Security\",\"authors\":\"Jongmin Lee, Donghyeon Lee, Yongmin Lee, Yoonmyung Lee\",\"doi\":\"10.1109/ISSCC.2018.8310219\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the advent of the IoT era, billions of devices are connected to networks, and assuring sufficient security at low cost is a critical concern. Physically Unclonable Functions (PUFs) have drawn increasing attention as key security building blocks for authentication since each PUF circuit has unique challenge response pairs (CRPs). Such uniqueness is achieved by maximizing the effects of process variation using process-sensitive circuits, i.e. PUF cells. Recently reported PUF cell types include cells based on a two-transistor amplifier [1], NAND gate [2], ring oscillator [3], current mirror [4], back-to-back connected inverters [5], and inverter [6]. Regardless of the variation source, PUFs inevitably include CRPs that respond inconsistently when the process variation of the compared element in the CRP is small compared to noise. For example, if the output of a two-transistor amplifier in [1] is near the switching threshold, the output can be inconsistent, resulting in bit error and an unstable CRP. Thus, efforts have focused on stabilizing unstable CRPs. The most straightforward stabilization scheme is temporal majority voting (TMV) [1,5], but the improvement in bit error rate (BER) and stability is limited since it does not directly address the instability of a given CRP. Trimming [2,3,5,6], another widely used approach, improves BER/stability by discarding unstable CRPs. However, stability evaluation is not very accurate, so the number of discarded CRPs can be significant (up to 30% in [3]), increasing the required silicon area for additional CRP generation and making it prohibitive for cost-sensitive IoT applications. This is especially true for weak PUFs. In this paper, a leakage-based PUF that allows lossless stabilization through remapping of unstable PUF cell pairs is presented. BER and stability comparable to, or better than, trimming stabilization method are achieved without discarding CRPs.\",\"PeriodicalId\":6617,\"journal\":{\"name\":\"2018 IEEE International Solid - State Circuits Conference - (ISSCC)\",\"volume\":\"31 1\",\"pages\":\"132-134\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"49\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Solid - State Circuits Conference - (ISSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2018.8310219\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Solid - State Circuits Conference - (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2018.8310219","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 49

摘要

随着物联网时代的到来,数十亿设备连接到网络,以低成本确保足够的安全性是一个关键问题。由于物理不可克隆函数(PUF)电路具有独特的挑战响应对(CRPs),因此作为身份验证的关键安全构建模块,PUF受到越来越多的关注。这种独特性是通过使用工艺敏感电路(即PUF细胞)最大化工艺变化的影响来实现的。最近报道的PUF电池类型包括基于双晶体管放大器[1]、NAND门[2]、环形振荡器[3]、电流镜[4]、背靠背连接逆变器[5]和逆变器[6]的电池。无论变化源如何,当CRP中比较元素的过程变化相对于噪声较小时,puf不可避免地包括响应不一致的CRP。例如,如果[1]中的双晶体管放大器的输出接近开关阈值,则输出可能不一致,从而导致误码和CRP不稳定。因此,努力的重点是稳定不稳定的crp。最直接的稳定方案是时间多数投票(TMV)[1,5],但误码率(BER)和稳定性的改善是有限的,因为它不能直接解决给定CRP的不稳定性。修剪[2,3,5,6]是另一种广泛使用的方法,通过丢弃不稳定的crp来提高BER/稳定性。然而,稳定性评估不是很准确,因此丢弃的CRP数量可能很大(在[3]中高达30%),增加了额外生成CRP所需的硅面积,使其无法用于成本敏感的物联网应用。对于弱puf来说尤其如此。本文提出了一种基于泄漏的PUF,通过重新映射不稳定的PUF单元对实现无损稳定。在不丢弃crp的情况下,实现了与修剪稳定方法相当或更好的BER和稳定性。
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A 445F2 leakage-based physically unclonable Function with Lossless Stabilization Through Remapping for IoT Security
With the advent of the IoT era, billions of devices are connected to networks, and assuring sufficient security at low cost is a critical concern. Physically Unclonable Functions (PUFs) have drawn increasing attention as key security building blocks for authentication since each PUF circuit has unique challenge response pairs (CRPs). Such uniqueness is achieved by maximizing the effects of process variation using process-sensitive circuits, i.e. PUF cells. Recently reported PUF cell types include cells based on a two-transistor amplifier [1], NAND gate [2], ring oscillator [3], current mirror [4], back-to-back connected inverters [5], and inverter [6]. Regardless of the variation source, PUFs inevitably include CRPs that respond inconsistently when the process variation of the compared element in the CRP is small compared to noise. For example, if the output of a two-transistor amplifier in [1] is near the switching threshold, the output can be inconsistent, resulting in bit error and an unstable CRP. Thus, efforts have focused on stabilizing unstable CRPs. The most straightforward stabilization scheme is temporal majority voting (TMV) [1,5], but the improvement in bit error rate (BER) and stability is limited since it does not directly address the instability of a given CRP. Trimming [2,3,5,6], another widely used approach, improves BER/stability by discarding unstable CRPs. However, stability evaluation is not very accurate, so the number of discarded CRPs can be significant (up to 30% in [3]), increasing the required silicon area for additional CRP generation and making it prohibitive for cost-sensitive IoT applications. This is especially true for weak PUFs. In this paper, a leakage-based PUF that allows lossless stabilization through remapping of unstable PUF cell pairs is presented. BER and stability comparable to, or better than, trimming stabilization method are achieved without discarding CRPs.
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