La0.7Ca0.3Mn1−XAlXO3薄膜的软x射线吸收光谱

Journal of Physics C: Solid State Physics Pub Date : 2014-04-24 DOI:10.1063/1.4872695

Manish Kumar, R. Choudhary, D. Phase

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引用次数: 0

摘要

稀土锰外延薄膜因其丰富的相图而引起了广泛的关注。这些薄膜的电子结构起着非常关键的作用，需要在器件制造之前有一个基本的了解。采用表面敏感的总电子产额(TEY)模式，利用软X射线吸收光谱技术研究了La0.7Ca0.3Mn1−XAlXO3 (X= 0,0.15)外延薄膜的电子结构。

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Soft X-ray absorption spectroscopy of La0.7Ca0.3Mn1−XAlXO3 thin films

Epitaxial thin films of rare earth manganites have generated much attention recently due to their rich phase diagram. The electronic structure of these films is playing a very crucial role and demands a fundamental understanding prior to device fabrication. We have investigated the electronic structure of La0.7Ca0.3Mn1−XAlXO3 (X=0, 0.15) epitaxial thin films by soft X-ray absorption spectroscopy technique using the surface sensitive total electron yield (TEY) mode.

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Journal of Physics C: Solid State Physics

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