G. Colliot, O. Lejeune, S. de Bentzmann, M. Tajani, N. Bonnet, E. Hirsch
{"title":"光和电子显微镜应用的上下文分析","authors":"G. Colliot, O. Lejeune, S. de Bentzmann, M. Tajani, N. Bonnet, E. Hirsch","doi":"10.1109/IEMBS.1992.5762252","DOIUrl":null,"url":null,"abstract":"The present paper describes the developement of an image analysis system devoted to applications in histology and electronic microscopy. The main characteristic of the system is its capacity to work simultaneously on more than one field of view and to handle different working magnifications. Finally it generates a complete map of analyzed sections.","PeriodicalId":6457,"journal":{"name":"1992 14th Annual International Conference of the IEEE Engineering in Medicine and Biology Society","volume":"2002 1","pages":"2233-2234"},"PeriodicalIF":0.0000,"publicationDate":"1992-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Contextual analysis for both light and electronic microscopy applications\",\"authors\":\"G. Colliot, O. Lejeune, S. de Bentzmann, M. Tajani, N. Bonnet, E. Hirsch\",\"doi\":\"10.1109/IEMBS.1992.5762252\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The present paper describes the developement of an image analysis system devoted to applications in histology and electronic microscopy. The main characteristic of the system is its capacity to work simultaneously on more than one field of view and to handle different working magnifications. Finally it generates a complete map of analyzed sections.\",\"PeriodicalId\":6457,\"journal\":{\"name\":\"1992 14th Annual International Conference of the IEEE Engineering in Medicine and Biology Society\",\"volume\":\"2002 1\",\"pages\":\"2233-2234\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1992 14th Annual International Conference of the IEEE Engineering in Medicine and Biology Society\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMBS.1992.5762252\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1992 14th Annual International Conference of the IEEE Engineering in Medicine and Biology Society","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMBS.1992.5762252","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Contextual analysis for both light and electronic microscopy applications
The present paper describes the developement of an image analysis system devoted to applications in histology and electronic microscopy. The main characteristic of the system is its capacity to work simultaneously on more than one field of view and to handle different working magnifications. Finally it generates a complete map of analyzed sections.
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