{"title":"具有灵活网格分配的区域高效标准单元布局生成器","authors":"S. Nishizawa, T. Ishihara, H. Onodera","doi":"10.2197/ipsjtsldm.8.131","DOIUrl":null,"url":null,"abstract":"This paper discusses a standard cell layout generator that can be used to generate a standard cell library optimized to a target application. It can generate an area efficient layout from a virtual-grid symbolic layout with the ability of flexible grid positioning that considers local design rules enforced in a scaled technology. The generator reduces the cost of library design and enables an optimization of each cell with detailed layout information that can be used to estimate the performance of the cell under design. A standard cell library has been generated for commercial 28-nm FDSOI CMOS process using the proposed layout generator, and used for circuit design. Correct operation of designed circuit is observed form fabricated chip test.","PeriodicalId":38964,"journal":{"name":"IPSJ Transactions on System LSI Design Methodology","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Layout Generator with Flexible Grid Assignment for Area Efficient Standard Cell\",\"authors\":\"S. Nishizawa, T. Ishihara, H. Onodera\",\"doi\":\"10.2197/ipsjtsldm.8.131\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper discusses a standard cell layout generator that can be used to generate a standard cell library optimized to a target application. It can generate an area efficient layout from a virtual-grid symbolic layout with the ability of flexible grid positioning that considers local design rules enforced in a scaled technology. The generator reduces the cost of library design and enables an optimization of each cell with detailed layout information that can be used to estimate the performance of the cell under design. A standard cell library has been generated for commercial 28-nm FDSOI CMOS process using the proposed layout generator, and used for circuit design. Correct operation of designed circuit is observed form fabricated chip test.\",\"PeriodicalId\":38964,\"journal\":{\"name\":\"IPSJ Transactions on System LSI Design Methodology\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IPSJ Transactions on System LSI Design Methodology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2197/ipsjtsldm.8.131\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IPSJ Transactions on System LSI Design Methodology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2197/ipsjtsldm.8.131","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
Layout Generator with Flexible Grid Assignment for Area Efficient Standard Cell
This paper discusses a standard cell layout generator that can be used to generate a standard cell library optimized to a target application. It can generate an area efficient layout from a virtual-grid symbolic layout with the ability of flexible grid positioning that considers local design rules enforced in a scaled technology. The generator reduces the cost of library design and enables an optimization of each cell with detailed layout information that can be used to estimate the performance of the cell under design. A standard cell library has been generated for commercial 28-nm FDSOI CMOS process using the proposed layout generator, and used for circuit design. Correct operation of designed circuit is observed form fabricated chip test.