{"title":"5.96 keV下In, Sn, Sb和Te的L - x射线微分截面的角依赖性","authors":"L. Demir, M. Sahin, Y. Sahin","doi":"10.1081/TMA-120025810","DOIUrl":null,"url":null,"abstract":"Abstract The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94° to 170° at intervals of 9°. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that L α peaks show anisotropic emissionn while L β and L γ peaks are emitted isotropically.","PeriodicalId":17525,"journal":{"name":"Journal of Trace and Microprobe Techniques","volume":"31 1","pages":"593 - 599"},"PeriodicalIF":0.0000,"publicationDate":"2003-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Angular Dependence of L X-Ray Differential Cross-Section for In, Sn, Sb, and Te at 5.96 keV\",\"authors\":\"L. Demir, M. Sahin, Y. Sahin\",\"doi\":\"10.1081/TMA-120025810\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94° to 170° at intervals of 9°. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that L α peaks show anisotropic emissionn while L β and L γ peaks are emitted isotropically.\",\"PeriodicalId\":17525,\"journal\":{\"name\":\"Journal of Trace and Microprobe Techniques\",\"volume\":\"31 1\",\"pages\":\"593 - 599\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-01-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Trace and Microprobe Techniques\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1081/TMA-120025810\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Trace and Microprobe Techniques","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1081/TMA-120025810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Angular Dependence of L X-Ray Differential Cross-Section for In, Sn, Sb, and Te at 5.96 keV
Abstract The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94° to 170° at intervals of 9°. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that L α peaks show anisotropic emissionn while L β and L γ peaks are emitted isotropically.
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