{"title":"核电厂低压电缆老化可靠性应力-强度模型的初步建立与应用","authors":"D. Fabiani, G. Mazzanti, S. V. Suraci, B. Diban","doi":"10.1109/ICD46958.2020.9341856","DOIUrl":null,"url":null,"abstract":"As a part of the H2020 EU Project called “TeaM Cables” - which has, among its aims, modelling reliability of Nuclear Power Plant (NPP) cables - the goal of this paper is to develop a model for the prediction of the residual reliability of Low Voltage (LV) cables for NPPs subjected to gamma radiation stress. The model estimates the probability that such cables withstand random stress overshoot in-service.","PeriodicalId":6795,"journal":{"name":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","volume":"122 1","pages":"37-40"},"PeriodicalIF":0.0000,"publicationDate":"2020-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Preliminary Development and Application of a Stress-Strength Model for Reliability Estimation of Aged LV Cables for Nuclear Power Plants\",\"authors\":\"D. Fabiani, G. Mazzanti, S. V. Suraci, B. Diban\",\"doi\":\"10.1109/ICD46958.2020.9341856\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As a part of the H2020 EU Project called “TeaM Cables” - which has, among its aims, modelling reliability of Nuclear Power Plant (NPP) cables - the goal of this paper is to develop a model for the prediction of the residual reliability of Low Voltage (LV) cables for NPPs subjected to gamma radiation stress. The model estimates the probability that such cables withstand random stress overshoot in-service.\",\"PeriodicalId\":6795,\"journal\":{\"name\":\"2020 IEEE 3rd International Conference on Dielectrics (ICD)\",\"volume\":\"122 1\",\"pages\":\"37-40\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-07-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE 3rd International Conference on Dielectrics (ICD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICD46958.2020.9341856\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE 3rd International Conference on Dielectrics (ICD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICD46958.2020.9341856","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Preliminary Development and Application of a Stress-Strength Model for Reliability Estimation of Aged LV Cables for Nuclear Power Plants
As a part of the H2020 EU Project called “TeaM Cables” - which has, among its aims, modelling reliability of Nuclear Power Plant (NPP) cables - the goal of this paper is to develop a model for the prediction of the residual reliability of Low Voltage (LV) cables for NPPs subjected to gamma radiation stress. The model estimates the probability that such cables withstand random stress overshoot in-service.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
