使用目标验证评估具有底层连续测量的二元测量系统

Sigeng Chen, S. Steiner, R. J. MacKay, Asokan Mulayath Variyath
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引用次数: 0

摘要

假设一个重要的具有规格的连续质量特性,用金标准测量系统来测量是昂贵的。100%合格/不合格检查方案使用二元测量系统,如无量规,以避免昂贵的金标准测量。检测方案会产生一些误差,我们感兴趣的是估计坏零件合格和好零件不合格的概率。我们假设检测系统不是破坏性的,所以我们可以多次检查零件,如果我们这样选择的话。如果我们使用金标准系统来确定零件是否在规格范围内,则对零件进行验证。我们提出并量化了一个新的具有成本效益的评估计划的好处,该计划只验证了为研究选择的一小部分。
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Assessing a binary measurement system with an underlying continuous measurand using targeted verification
Abstract Suppose an important continuous quality characteristic with specification is expensive to measure with a gold standard measurement system. A 100% pass/fail inspection scheme uses a binary measurement system such as a no-go gauge to avoid the expensive gold standard measurements. The inspection scheme makes some errors and we are interested in estimating both the probability of passing a bad part and of failing a good part. We assume that the inspection system is not destructive so we can inspect parts multiple times if we so choose. A part is verified if we use the gold standard system to determine if the part is within specification or not. We propose and quantify the benefits of a new cost-effective assessment plan that verifies only a small fraction of the parts selected for the study.
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