{"title":"大流行后会议:2023年的经验","authors":"I. O’Connor, R. Wille, A. Pimentel, V. Bertacco","doi":"10.1109/mdat.2023.3287930","DOIUrl":null,"url":null,"abstract":"Digital Object Identier 10.1109/MDAT.2023.3287930 Date of current version: 29 August 2023. DATE is A leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. Almost four years had passed since we closed the doors on the last in-person edition of the DATE conference. With three online editions due to COVID19 and in anticipation of a return to a full in-person format, the DATE Sponsors Committee felt that the conference needed to put interaction, as well as reinforcing and rebuilding links in the community, at the heart of the event. In this spirit, the postpandemic 2023 edition of DATE had a substantially reworked format intending for significant added value for in-person participation, with more focus on interaction and condensed down to three days. The intent was that, in this way, the community could actually do what DATE is for meeting, discussing, and exchanging the latest progress in design and design automation. The 26th DATE conference was held at the Flanders Meeting and Convention Center in Antwerp, Belgium, from 17 to 19 April 2023 and offered an exciting, wide-ranging technical program.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"34 1","pages":"104-112"},"PeriodicalIF":1.9000,"publicationDate":"2023-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Postpandemic Conferences: The DATE 2023 Experience\",\"authors\":\"I. O’Connor, R. Wille, A. Pimentel, V. Bertacco\",\"doi\":\"10.1109/mdat.2023.3287930\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Digital Object Identier 10.1109/MDAT.2023.3287930 Date of current version: 29 August 2023. DATE is A leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. Almost four years had passed since we closed the doors on the last in-person edition of the DATE conference. With three online editions due to COVID19 and in anticipation of a return to a full in-person format, the DATE Sponsors Committee felt that the conference needed to put interaction, as well as reinforcing and rebuilding links in the community, at the heart of the event. In this spirit, the postpandemic 2023 edition of DATE had a substantially reworked format intending for significant added value for in-person participation, with more focus on interaction and condensed down to three days. The intent was that, in this way, the community could actually do what DATE is for meeting, discussing, and exchanging the latest progress in design and design automation. The 26th DATE conference was held at the Flanders Meeting and Convention Center in Antwerp, Belgium, from 17 to 19 April 2023 and offered an exciting, wide-ranging technical program.\",\"PeriodicalId\":48917,\"journal\":{\"name\":\"IEEE Design & Test\",\"volume\":\"34 1\",\"pages\":\"104-112\"},\"PeriodicalIF\":1.9000,\"publicationDate\":\"2023-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Design & Test\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/mdat.2023.3287930\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Design & Test","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/mdat.2023.3287930","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Postpandemic Conferences: The DATE 2023 Experience
Digital Object Identier 10.1109/MDAT.2023.3287930 Date of current version: 29 August 2023. DATE is A leading international event providing unique networking opportunities. The conference brings together designers and design automation users, researchers, and vendors, as well as specialists in hardware and software design, testing, and manufacturing of electronic circuits and systems—from system-level hardware and software implementation down to integrated circuit design. Almost four years had passed since we closed the doors on the last in-person edition of the DATE conference. With three online editions due to COVID19 and in anticipation of a return to a full in-person format, the DATE Sponsors Committee felt that the conference needed to put interaction, as well as reinforcing and rebuilding links in the community, at the heart of the event. In this spirit, the postpandemic 2023 edition of DATE had a substantially reworked format intending for significant added value for in-person participation, with more focus on interaction and condensed down to three days. The intent was that, in this way, the community could actually do what DATE is for meeting, discussing, and exchanging the latest progress in design and design automation. The 26th DATE conference was held at the Flanders Meeting and Convention Center in Antwerp, Belgium, from 17 to 19 April 2023 and offered an exciting, wide-ranging technical program.
期刊介绍:
IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.