{"title":"利用STM32实现工艺参数的高速遥感","authors":"S. Kedar, P. Saxena, Lekha Das","doi":"10.1109/ICAECCT.2016.7942611","DOIUrl":null,"url":null,"abstract":"Sensing process parameter is imperative for signal readout in radiation detectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizing radiations. The presented work aims to describe an advanced data acquisition system for accurate measurement of the parameters. A circuit is designed and developed for sensing process parameter that is ionization current using all in one 32-bit microcontroller STM32F401RE for ionization chamber data acquisition.","PeriodicalId":6629,"journal":{"name":"2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)","volume":"58 1","pages":"349-351"},"PeriodicalIF":0.0000,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"High speed remote sensing of process parameters using STM32\",\"authors\":\"S. Kedar, P. Saxena, Lekha Das\",\"doi\":\"10.1109/ICAECCT.2016.7942611\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Sensing process parameter is imperative for signal readout in radiation detectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizing radiations. The presented work aims to describe an advanced data acquisition system for accurate measurement of the parameters. A circuit is designed and developed for sensing process parameter that is ionization current using all in one 32-bit microcontroller STM32F401RE for ionization chamber data acquisition.\",\"PeriodicalId\":6629,\"journal\":{\"name\":\"2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)\",\"volume\":\"58 1\",\"pages\":\"349-351\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICAECCT.2016.7942611\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICAECCT.2016.7942611","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
High speed remote sensing of process parameters using STM32
Sensing process parameter is imperative for signal readout in radiation detectors, exclusively in the ionization chamber which are widely used for the measurement of flux of the ionizing radiations. The presented work aims to describe an advanced data acquisition system for accurate measurement of the parameters. A circuit is designed and developed for sensing process parameter that is ionization current using all in one 32-bit microcontroller STM32F401RE for ionization chamber data acquisition.
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