无助焊剂激光喷射焊球焊中焊垫污染对Au/Sn-3.0Ag-0.5Cu/Au焊点润湿性的影响

W. Yue, Min-bo Zhou, Xin-Ping Zhang
{"title":"无助焊剂激光喷射焊球焊中焊垫污染对Au/Sn-3.0Ag-0.5Cu/Au焊点润湿性的影响","authors":"W. Yue, Min-bo Zhou, Xin-Ping Zhang","doi":"10.1109/ICEPT.2016.7583339","DOIUrl":null,"url":null,"abstract":"With the advantages of non-contact, flexible, high energy density and local heating, the laser jet solder ball bonding (SBB) technique is widely used in electronic packaging. The reliability of laser jet SBB solder joints has long been concerned. As is well known, the wettability (i.e., the spreading ability) of the molten solder on the boding pad is a key factor influencing the formation and performance of solder joints. Previous studies have revealed that the oxidation of the solder balls can lead to the poor wetting during the laser jet SBB process. Meanwhile, the surface contamination of the bonding pads is inevitable in mass production, which may be another essential factor causing the soldering quality problem for the flux-free laser jet SBB process and the mechanism is still unclear so far. In this study, the factors leading to the poor wetting of 90 μm diameter Sn-3.0Ag-0.5Cu solder balls on Au bonding pads have been ascertained, in particular the surface contamination of Au bonding pads is investigated by using a surface analytical technique called Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS). When the possibility of the oxidation layer of solder balls is excluded, the poor wetting of Au/Sn-3.0Ag-0.5Cu/Au solder joints is caused dominantly by the surface contamination of Au bonding pads. So, the surface elements of the poorly wetted bonding pads and the normal ones were comparatively investigated by employing TOF-SIMS with the intensity of the contamination. The results manifest obviously that the surface contamination of Au bonding pads is closely correlated with the poor wettability. The intensity of Au peak on the normal pad is higher, while being lower on the poorly wetted pads. In addition, the characteristic peaks of few organics are also found, indicating that the Au bonding pads are contaminated and evenly covered by some organic and inorganic contaminants, which directly lead to the poor wettability of solder joints during flux-free laser jet SBB process. Further, the mechanism of the poorly wetted solder joints induced by the contamination is analyzed and the near quantitative results are also discussed.","PeriodicalId":6881,"journal":{"name":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","volume":"26 1","pages":"1201-1205"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Effect of the Au bonding pad contamination on the wettability of Au/Sn-3.0Ag-0.5Cu/Au solder joints in flux-free laser jet solder ball bonding process\",\"authors\":\"W. Yue, Min-bo Zhou, Xin-Ping Zhang\",\"doi\":\"10.1109/ICEPT.2016.7583339\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"With the advantages of non-contact, flexible, high energy density and local heating, the laser jet solder ball bonding (SBB) technique is widely used in electronic packaging. The reliability of laser jet SBB solder joints has long been concerned. As is well known, the wettability (i.e., the spreading ability) of the molten solder on the boding pad is a key factor influencing the formation and performance of solder joints. Previous studies have revealed that the oxidation of the solder balls can lead to the poor wetting during the laser jet SBB process. Meanwhile, the surface contamination of the bonding pads is inevitable in mass production, which may be another essential factor causing the soldering quality problem for the flux-free laser jet SBB process and the mechanism is still unclear so far. In this study, the factors leading to the poor wetting of 90 μm diameter Sn-3.0Ag-0.5Cu solder balls on Au bonding pads have been ascertained, in particular the surface contamination of Au bonding pads is investigated by using a surface analytical technique called Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS). When the possibility of the oxidation layer of solder balls is excluded, the poor wetting of Au/Sn-3.0Ag-0.5Cu/Au solder joints is caused dominantly by the surface contamination of Au bonding pads. So, the surface elements of the poorly wetted bonding pads and the normal ones were comparatively investigated by employing TOF-SIMS with the intensity of the contamination. The results manifest obviously that the surface contamination of Au bonding pads is closely correlated with the poor wettability. The intensity of Au peak on the normal pad is higher, while being lower on the poorly wetted pads. In addition, the characteristic peaks of few organics are also found, indicating that the Au bonding pads are contaminated and evenly covered by some organic and inorganic contaminants, which directly lead to the poor wettability of solder joints during flux-free laser jet SBB process. Further, the mechanism of the poorly wetted solder joints induced by the contamination is analyzed and the near quantitative results are also discussed.\",\"PeriodicalId\":6881,\"journal\":{\"name\":\"2016 17th International Conference on Electronic Packaging Technology (ICEPT)\",\"volume\":\"26 1\",\"pages\":\"1201-1205\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 17th International Conference on Electronic Packaging Technology (ICEPT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICEPT.2016.7583339\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2016.7583339","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

激光喷射焊球键合(SBB)技术具有非接触、柔性、高能量密度和局部加热等优点,广泛应用于电子封装领域。激光喷射SBB焊点的可靠性一直是人们关注的问题。众所周知,熔锡在焊盘上的润湿性(即扩散能力)是影响焊点形成和性能的关键因素。以往的研究表明,在激光喷射SBB过程中,焊料球的氧化会导致润湿性差。同时,焊盘的表面污染在批量生产中是不可避免的,这可能是造成无助焊剂激光喷射SBB工艺焊接质量问题的另一个重要因素,其机理目前尚不清楚。在本研究中,确定了导致90 μm直径Sn-3.0Ag-0.5Cu焊锡球在金焊盘上润湿不良的因素,特别是利用飞行时间二次离子质谱(TOF-SIMS)表面分析技术研究了金焊盘的表面污染。在排除焊球氧化层的可能性后,Au/Sn-3.0Ag-0.5Cu/Au焊点润湿性差的主要原因是Au焊盘的表面污染。因此,利用TOF-SIMS对湿性差的焊盘和正常焊盘的表面元素进行了比较研究,并对污染强度进行了分析。结果表明,焊盘表面污染与焊盘润湿性差密切相关。正常焊盘上的Au峰强度较高,而湿性较差的焊盘上的Au峰强度较低。此外,还发现了少量有机物的特征峰,表明金焊焊垫被一些有机和无机污染物污染并均匀覆盖,这直接导致无助焊剂激光喷射SBB过程中焊点润湿性差。进一步分析了污染导致焊点润湿不良的机理,并对近定量结果进行了讨论。
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Effect of the Au bonding pad contamination on the wettability of Au/Sn-3.0Ag-0.5Cu/Au solder joints in flux-free laser jet solder ball bonding process
With the advantages of non-contact, flexible, high energy density and local heating, the laser jet solder ball bonding (SBB) technique is widely used in electronic packaging. The reliability of laser jet SBB solder joints has long been concerned. As is well known, the wettability (i.e., the spreading ability) of the molten solder on the boding pad is a key factor influencing the formation and performance of solder joints. Previous studies have revealed that the oxidation of the solder balls can lead to the poor wetting during the laser jet SBB process. Meanwhile, the surface contamination of the bonding pads is inevitable in mass production, which may be another essential factor causing the soldering quality problem for the flux-free laser jet SBB process and the mechanism is still unclear so far. In this study, the factors leading to the poor wetting of 90 μm diameter Sn-3.0Ag-0.5Cu solder balls on Au bonding pads have been ascertained, in particular the surface contamination of Au bonding pads is investigated by using a surface analytical technique called Time-of-flight Secondary Ion Mass Spectrometry (TOF-SIMS). When the possibility of the oxidation layer of solder balls is excluded, the poor wetting of Au/Sn-3.0Ag-0.5Cu/Au solder joints is caused dominantly by the surface contamination of Au bonding pads. So, the surface elements of the poorly wetted bonding pads and the normal ones were comparatively investigated by employing TOF-SIMS with the intensity of the contamination. The results manifest obviously that the surface contamination of Au bonding pads is closely correlated with the poor wettability. The intensity of Au peak on the normal pad is higher, while being lower on the poorly wetted pads. In addition, the characteristic peaks of few organics are also found, indicating that the Au bonding pads are contaminated and evenly covered by some organic and inorganic contaminants, which directly lead to the poor wettability of solder joints during flux-free laser jet SBB process. Further, the mechanism of the poorly wetted solder joints induced by the contamination is analyzed and the near quantitative results are also discussed.
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