柔性基板上薄膜晶体管的机械应力模拟

S. Kong, Heetaek Lim, A. Hoessinger, E. Guichard
{"title":"柔性基板上薄膜晶体管的机械应力模拟","authors":"S. Kong, Heetaek Lim, A. Hoessinger, E. Guichard","doi":"10.1109/IFETC.2018.8583964","DOIUrl":null,"url":null,"abstract":"The mechanical stress in a thin-film transistor on flexible substrate is the most important problem in display industry. It causes to change electrical performance when bending, stretching, and other possible mechanical deformation stress are applied to film stack, or when repeated deformation is performed to thin film device on flexible substrate. There are few literatures to describe the mechanical stress calculation based on analytic calculation when bending moment is quite small and substrate is larger than film thickness, but this approach has a limitation to extend mechanically large deformed device on a flexible substrate. This motivates us to develop a comprehensive numerical stress model for simulating thin film transistor device on flexible substrate.","PeriodicalId":6609,"journal":{"name":"2018 International Flexible Electronics Technology Conference (IFETC)","volume":"9 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Mechanical Stress Simulation of Thin Film Transistor on Flexible Substrate\",\"authors\":\"S. Kong, Heetaek Lim, A. Hoessinger, E. Guichard\",\"doi\":\"10.1109/IFETC.2018.8583964\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The mechanical stress in a thin-film transistor on flexible substrate is the most important problem in display industry. It causes to change electrical performance when bending, stretching, and other possible mechanical deformation stress are applied to film stack, or when repeated deformation is performed to thin film device on flexible substrate. There are few literatures to describe the mechanical stress calculation based on analytic calculation when bending moment is quite small and substrate is larger than film thickness, but this approach has a limitation to extend mechanically large deformed device on a flexible substrate. This motivates us to develop a comprehensive numerical stress model for simulating thin film transistor device on flexible substrate.\",\"PeriodicalId\":6609,\"journal\":{\"name\":\"2018 International Flexible Electronics Technology Conference (IFETC)\",\"volume\":\"9 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Flexible Electronics Technology Conference (IFETC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IFETC.2018.8583964\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Flexible Electronics Technology Conference (IFETC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IFETC.2018.8583964","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

柔性基板上薄膜晶体管的机械应力是显示工业中最重要的问题。当对薄膜堆施加弯曲、拉伸和其他可能的机械变形应力时,或对柔性基板上的薄膜装置进行重复变形时,会引起电性能的变化。在弯矩很小且基材大于薄膜厚度的情况下,基于解析计算的机械应力计算文献很少,但这种方法对在柔性基材上扩展机械大变形器件有一定的局限性。这促使我们开发一个全面的数值应力模型来模拟柔性衬底上的薄膜晶体管器件。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Mechanical Stress Simulation of Thin Film Transistor on Flexible Substrate
The mechanical stress in a thin-film transistor on flexible substrate is the most important problem in display industry. It causes to change electrical performance when bending, stretching, and other possible mechanical deformation stress are applied to film stack, or when repeated deformation is performed to thin film device on flexible substrate. There are few literatures to describe the mechanical stress calculation based on analytic calculation when bending moment is quite small and substrate is larger than film thickness, but this approach has a limitation to extend mechanically large deformed device on a flexible substrate. This motivates us to develop a comprehensive numerical stress model for simulating thin film transistor device on flexible substrate.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Inkjet Printed Hybrid Organic-Quantum Dots Solar Cells: Effects of Pre- And Post-Printing Activities Fabrication and Performance Evaluation of Carbon-based Stretchable RFID Tags on Textile Substrates 0–3 Polymer/Barium Titanate Nano Structures Based Flexible Piezoelectric Film A Versatile Low Temperature Curing Molecular Silver Ink Platform for Printed Electronics Screen Printed Vias for a Flexible Energy Harvesting and Storage Module
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1