{"title":"半导体碳纳米管晶体管的扫描光电流显微镜","authors":"Y. Ahn, Jiwoong Park","doi":"10.1109/QELS.2007.4431777","DOIUrl":null,"url":null,"abstract":"Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.","PeriodicalId":21999,"journal":{"name":"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference","volume":"302 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Scanning photocurrent microscopy in semiconducting carbon nanotube transistors\",\"authors\":\"Y. Ahn, Jiwoong Park\",\"doi\":\"10.1109/QELS.2007.4431777\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.\",\"PeriodicalId\":21999,\"journal\":{\"name\":\"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference\",\"volume\":\"302 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/QELS.2007.4431777\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Summaries of Papers Presented at the Quantum Electronics and Laser Science Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/QELS.2007.4431777","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Scanning photocurrent microscopy in semiconducting carbon nanotube transistors
Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
