{"title":"用三点滚动试验表征柔性器件","authors":"Mukunda Madhava Nath, G. Gupta","doi":"10.1109/IFETC.2018.8583958","DOIUrl":null,"url":null,"abstract":"Mechanical reliability is the one of the critical aspect of flexible or foldable electronic devices. As new flexible components emerge, new paradigms for mechanical testing and simulations will be required. Standardized characterization test methods such as the 3-point bend test only account for small displacements and large radius of curvature and might not be applicable to foldable device as is. In this paper we propose a 3-point rolling test setup that can be used to achieve a range of radius of curvature. Additioanlly we evaluate the strain response of the device using an equivalent simulation model. We further evaluate the effect of different design parameters like layer thickness and modulus on the reliability of the device using a Taguchi design of experiments.","PeriodicalId":6609,"journal":{"name":"2018 International Flexible Electronics Technology Conference (IFETC)","volume":"8 1","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2018-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Characterization of a Flexible Device using a 3-Point Rolling Test\",\"authors\":\"Mukunda Madhava Nath, G. Gupta\",\"doi\":\"10.1109/IFETC.2018.8583958\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Mechanical reliability is the one of the critical aspect of flexible or foldable electronic devices. As new flexible components emerge, new paradigms for mechanical testing and simulations will be required. Standardized characterization test methods such as the 3-point bend test only account for small displacements and large radius of curvature and might not be applicable to foldable device as is. In this paper we propose a 3-point rolling test setup that can be used to achieve a range of radius of curvature. Additioanlly we evaluate the strain response of the device using an equivalent simulation model. We further evaluate the effect of different design parameters like layer thickness and modulus on the reliability of the device using a Taguchi design of experiments.\",\"PeriodicalId\":6609,\"journal\":{\"name\":\"2018 International Flexible Electronics Technology Conference (IFETC)\",\"volume\":\"8 1\",\"pages\":\"1-5\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Flexible Electronics Technology Conference (IFETC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IFETC.2018.8583958\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Flexible Electronics Technology Conference (IFETC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IFETC.2018.8583958","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Characterization of a Flexible Device using a 3-Point Rolling Test
Mechanical reliability is the one of the critical aspect of flexible or foldable electronic devices. As new flexible components emerge, new paradigms for mechanical testing and simulations will be required. Standardized characterization test methods such as the 3-point bend test only account for small displacements and large radius of curvature and might not be applicable to foldable device as is. In this paper we propose a 3-point rolling test setup that can be used to achieve a range of radius of curvature. Additioanlly we evaluate the strain response of the device using an equivalent simulation model. We further evaluate the effect of different design parameters like layer thickness and modulus on the reliability of the device using a Taguchi design of experiments.