沿晶体截断棒的散射x射线强度测定了Ge(111)-c(2 × 8)表面的结构

R. V. Silfhout, J. V. D. Veen, C. Norris, J. E. MacDonald
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引用次数: 32

摘要

在对c(2 × 8)重构的Ge(111)表面的x射线衍射研究中,我们沿着垂直于表面的整阶布拉格散射棒测量了强度分布。衍射强度分布是用一个简单的原子模型来解释的。在扭曲的块状底物上发现配体占据T4位点。我们排除了任何基于衬底层错的c(2 × 8)重构模型。对于adatom模型,我们给出了原子在表面位置的最佳拟合值,并将其与从总能量和基态能量最小化计算中得到的结果进行了比较。
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Structure of the Ge(111)-c(2 × 8) surface as determined from scattered X-ray intensities along crystal truncation rods
In an X-ray diffraction study of the c(2 × 8) reconstructed Ge(111) surface we have measured intensity profiles along integer-order rods of Bragg scattering perpendicular to the surface plane. The diffracted intensity profiles are explained in terms of a simple adatom model for the reconstruction. The adatoms are found to occupy T4 sites on a distorted bulk-like substrate. We rule out any model for c(2 × 8) reconstruction that is based on stacking faults in the substrate. For the adatom model we give best-fit values for the positions of the atoms at the surface and compare them with those obtained from total-energy and keating-energy minimisation calculations.
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