M. Franz, R. Ecke, C. Kaufmann, J. Kriz, S. Schulz
{"title":"CuMn、CuTi和CuZr合金的势垒形成及自形成势垒的稳定性研究","authors":"M. Franz, R. Ecke, C. Kaufmann, J. Kriz, S. Schulz","doi":"10.1109/IITC-MAM.2015.7325640","DOIUrl":null,"url":null,"abstract":"In this work, we present the recent work on self-forming barriers. Focus on investigation laid on the barrier formation and its stability against copper diffusion. The investigated alloys were Cu(Mn), Cu(Ti) and Cu(Zr) respectively. It can be shown that these alloys are capable to form an enrichment layer on the SiO2 interface. Here the substrate influences mainly the thickness of the generated barrier. Electrical measurements show the barrier stability against copper diffusion. Mn and Ti are promising elements as barrier materials.","PeriodicalId":6514,"journal":{"name":"2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)","volume":"64 1","pages":"95-98"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Investigation of barrier formation and stability of self-forming barriers with CuMn, CuTi and CuZr alloys\",\"authors\":\"M. Franz, R. Ecke, C. Kaufmann, J. Kriz, S. Schulz\",\"doi\":\"10.1109/IITC-MAM.2015.7325640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we present the recent work on self-forming barriers. Focus on investigation laid on the barrier formation and its stability against copper diffusion. The investigated alloys were Cu(Mn), Cu(Ti) and Cu(Zr) respectively. It can be shown that these alloys are capable to form an enrichment layer on the SiO2 interface. Here the substrate influences mainly the thickness of the generated barrier. Electrical measurements show the barrier stability against copper diffusion. Mn and Ti are promising elements as barrier materials.\",\"PeriodicalId\":6514,\"journal\":{\"name\":\"2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)\",\"volume\":\"64 1\",\"pages\":\"95-98\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IITC-MAM.2015.7325640\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IITC-MAM.2015.7325640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of barrier formation and stability of self-forming barriers with CuMn, CuTi and CuZr alloys
In this work, we present the recent work on self-forming barriers. Focus on investigation laid on the barrier formation and its stability against copper diffusion. The investigated alloys were Cu(Mn), Cu(Ti) and Cu(Zr) respectively. It can be shown that these alloys are capable to form an enrichment layer on the SiO2 interface. Here the substrate influences mainly the thickness of the generated barrier. Electrical measurements show the barrier stability against copper diffusion. Mn and Ti are promising elements as barrier materials.
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