Dongil Lee, Taeho Lee, Yong-Hun Kim, Young-Ju Kim, L. Kim
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An injection locked PLL for power supply variation robustness using negative phase shift phenomenon of injection locked frequency divider
This paper presents a 2 GHz injection-locked PLL (ILPLL) with an injection-locked frequency divider (ILFD). Using a negative phase shift phenomenon of the ILFD, injection timing can be calibrated without a delay line. As a result, the proposed ILPLL achieves a simple background injection timing calibration for robustness of power supply variation. The test core has been fabricated in 65nm CMOS process consuming 3.74mW at 0.9V supply voltage.
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