{"title":"缺陷像素的自适应检测与隐藏算法","authors":"Jeehoon An, Wonjae Lee, Jaeseok Kim","doi":"10.1109/SIPS.2007.4387626","DOIUrl":null,"url":null,"abstract":"This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.","PeriodicalId":93225,"journal":{"name":"Proceedings. IEEE Workshop on Signal Processing Systems (2007-2014)","volume":"29 1","pages":"651-656"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Adaptive Detection and Concealment Algorithm of Defective Pixel\",\"authors\":\"Jeehoon An, Wonjae Lee, Jaeseok Kim\",\"doi\":\"10.1109/SIPS.2007.4387626\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.\",\"PeriodicalId\":93225,\"journal\":{\"name\":\"Proceedings. IEEE Workshop on Signal Processing Systems (2007-2014)\",\"volume\":\"29 1\",\"pages\":\"651-656\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. IEEE Workshop on Signal Processing Systems (2007-2014)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SIPS.2007.4387626\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. IEEE Workshop on Signal Processing Systems (2007-2014)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIPS.2007.4387626","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Adaptive Detection and Concealment Algorithm of Defective Pixel
This paper proposes a defective pixel detection algorithm for CCD/CMOS image sensors and its hardware architecture. In previous algorithms, the characteristics of images have not been considered and normal pixels can be treated as defective pixels with high possibility. In order to make up for those disadvantages, the proposed algorithm detects defective pixels by considering the characteristics of the image and verifies them using several frames while checking scene-changes. Whenever a scene-change is occurred, potentially defective pixels are detected and verified. The proposed algorithm was implemented with Verilog HDL. Total logic gate count was 5.1k using 0.25um CMOS standard cell library.