{"title":"用半导体探测器测量伽马和x射线发射率时的自然线宽效应","authors":"K. Debertin, W. Pessara","doi":"10.1016/0029-554X(81)90753-9","DOIUrl":null,"url":null,"abstract":"<div><p>The peak shapes of X-ray lines vary from those of gamma-ray lines in spectra obtained from semiconductor detectors due to different natural line widths for both types of radiation. This excludes the application of the same peak evaluation method for both gamma and X-ray peaks and complicates gamma-ray emission rate determinations with detectors calibrated by X-ray sources and vice versa. The order of magnitude of possible errors is calculated and ways to overcome the problem are discussed.</p></div>","PeriodicalId":100971,"journal":{"name":"Nuclear Instruments and Methods","volume":"184 2","pages":"Pages 497-503"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/0029-554X(81)90753-9","citationCount":"24","resultStr":"{\"title\":\"Natural line-width effects in gamma- and X-ray emission rate measurements with semiconductor detectors\",\"authors\":\"K. Debertin, W. Pessara\",\"doi\":\"10.1016/0029-554X(81)90753-9\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>The peak shapes of X-ray lines vary from those of gamma-ray lines in spectra obtained from semiconductor detectors due to different natural line widths for both types of radiation. This excludes the application of the same peak evaluation method for both gamma and X-ray peaks and complicates gamma-ray emission rate determinations with detectors calibrated by X-ray sources and vice versa. The order of magnitude of possible errors is calculated and ways to overcome the problem are discussed.</p></div>\",\"PeriodicalId\":100971,\"journal\":{\"name\":\"Nuclear Instruments and Methods\",\"volume\":\"184 2\",\"pages\":\"Pages 497-503\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/0029-554X(81)90753-9\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nuclear Instruments and Methods\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/0029554X81907539\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Instruments and Methods","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/0029554X81907539","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Natural line-width effects in gamma- and X-ray emission rate measurements with semiconductor detectors
The peak shapes of X-ray lines vary from those of gamma-ray lines in spectra obtained from semiconductor detectors due to different natural line widths for both types of radiation. This excludes the application of the same peak evaluation method for both gamma and X-ray peaks and complicates gamma-ray emission rate determinations with detectors calibrated by X-ray sources and vice versa. The order of magnitude of possible errors is calculated and ways to overcome the problem are discussed.
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