光伏组件的温度测试和分析PER ANSI/UL 1703和IEC 61730标准

Jaewon Oh, G. Tamizhmani
{"title":"光伏组件的温度测试和分析PER ANSI/UL 1703和IEC 61730标准","authors":"Jaewon Oh, G. Tamizhmani","doi":"10.1109/PVSC.2010.5614569","DOIUrl":null,"url":null,"abstract":"The photovoltaic (PV) modules exposed to the sunlight under typical field conditions experience much higher temperatures than the ambient temperatures. In the hot climatic conditions such as Arizona, the module temperatures could reach as high as 85°C to 95°C depending on the mounting and operating configurations. In the worst case scenarios such as partial shading of PV cells of air gap free rooftop modules, some of the components might attain high enough temperatures that could compromise the safety and functionality requirements of the module and its components. Currently, two module safety standards are extensively used: IEC 61730-2 (international) and ANSI/UL 1703 (United States). These standards provide procedures to determine the maximum reference temperatures of various components and materials of a PV module. This paper presents and analyzes the temperature test results obtained on 9 different components of a PV module: front glass, substrate/backsheet (polymer), PV cell, j-box ambient, j-box surface, positive terminal, backsheet inside j-box, field wiring and diode. The temperature test results of about 140 crystalline silicon modules from a large number of manufacturers who tested modules between 2006 and 2009 at ASU/TUV-PTL are analyzed under three test conditions: short-circuit, open-circuit and short-circuit and shaded.","PeriodicalId":6424,"journal":{"name":"2010 35th IEEE Photovoltaic Specialists Conference","volume":"55 7","pages":"000984-000988"},"PeriodicalIF":0.0000,"publicationDate":"2010-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":"{\"title\":\"Temperature testing and analysis of PV modules PER ANSI/UL 1703 and IEC 61730 standards\",\"authors\":\"Jaewon Oh, G. Tamizhmani\",\"doi\":\"10.1109/PVSC.2010.5614569\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The photovoltaic (PV) modules exposed to the sunlight under typical field conditions experience much higher temperatures than the ambient temperatures. In the hot climatic conditions such as Arizona, the module temperatures could reach as high as 85°C to 95°C depending on the mounting and operating configurations. In the worst case scenarios such as partial shading of PV cells of air gap free rooftop modules, some of the components might attain high enough temperatures that could compromise the safety and functionality requirements of the module and its components. Currently, two module safety standards are extensively used: IEC 61730-2 (international) and ANSI/UL 1703 (United States). These standards provide procedures to determine the maximum reference temperatures of various components and materials of a PV module. This paper presents and analyzes the temperature test results obtained on 9 different components of a PV module: front glass, substrate/backsheet (polymer), PV cell, j-box ambient, j-box surface, positive terminal, backsheet inside j-box, field wiring and diode. The temperature test results of about 140 crystalline silicon modules from a large number of manufacturers who tested modules between 2006 and 2009 at ASU/TUV-PTL are analyzed under three test conditions: short-circuit, open-circuit and short-circuit and shaded.\",\"PeriodicalId\":6424,\"journal\":{\"name\":\"2010 35th IEEE Photovoltaic Specialists Conference\",\"volume\":\"55 7\",\"pages\":\"000984-000988\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-06-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"24\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 35th IEEE Photovoltaic Specialists Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2010.5614569\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 35th IEEE Photovoltaic Specialists Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2010.5614569","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24

摘要

在典型的野外条件下,暴露在阳光下的光伏(PV)组件的温度要比环境温度高得多。在炎热的气候条件下,如亚利桑那州,根据安装和操作配置,模块温度可高达85°C至95°C。在最坏的情况下,如无气隙屋顶组件的光伏电池部分遮阳,一些组件可能会达到足够高的温度,从而可能危及组件及其组件的安全性和功能要求。目前,广泛使用的两个模块安全标准是IEC 61730-2(国际)和ANSI/UL 1703(美国)。这些标准提供了确定PV组件的各种组件和材料的最高参考温度的程序。本文介绍并分析了光伏组件9个不同组件的温度测试结果:前玻璃、基板/背板(聚合物)、光伏电池、j-box环境、j-box表面、正极、j-box内背板、现场接线和二极管。分析了2006年至2009年在ASU/TUV-PTL测试的140多家厂商的晶体硅组件在短路、开路、短路和阴影三种测试条件下的温度测试结果。
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Temperature testing and analysis of PV modules PER ANSI/UL 1703 and IEC 61730 standards
The photovoltaic (PV) modules exposed to the sunlight under typical field conditions experience much higher temperatures than the ambient temperatures. In the hot climatic conditions such as Arizona, the module temperatures could reach as high as 85°C to 95°C depending on the mounting and operating configurations. In the worst case scenarios such as partial shading of PV cells of air gap free rooftop modules, some of the components might attain high enough temperatures that could compromise the safety and functionality requirements of the module and its components. Currently, two module safety standards are extensively used: IEC 61730-2 (international) and ANSI/UL 1703 (United States). These standards provide procedures to determine the maximum reference temperatures of various components and materials of a PV module. This paper presents and analyzes the temperature test results obtained on 9 different components of a PV module: front glass, substrate/backsheet (polymer), PV cell, j-box ambient, j-box surface, positive terminal, backsheet inside j-box, field wiring and diode. The temperature test results of about 140 crystalline silicon modules from a large number of manufacturers who tested modules between 2006 and 2009 at ASU/TUV-PTL are analyzed under three test conditions: short-circuit, open-circuit and short-circuit and shaded.
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